Yue Jia Vis

*	2009
2	EE	William B. Langdon, Mark Harman, Yue Jia: Multi objective higher order mutation testing with GP. GECCO 2009: 1945-1946
	2008
1	EE	Yue Jia, Mark Harman: Constructing Subtle Faults Using Higher Order Mutation Testing. SCAM 2008: 249-258

Coauthor Index

1	Mark Harman	[1] [2]
2	William B. Langdon	[2]