| |
| 2007 | ||
|---|---|---|
| 2 | EE | Hiroyuki Iwata, Tomokazu Yoneda, Hideo Fujiwara: A DFT Method for Time Expansion Model at Register Transfer Level. DAC 2007: 682-687 |
| 2005 | ||
| 1 | EE | Hiroyuki Iwata, Tomokazu Yoneda, Satoshi Ohtake, Hideo Fujiwara: A DFT Method for RTL Data Paths Based on Partially Strong Testability to Guarantee Complete Fault Efficiency. Asian Test Symposium 2005: 306-311 |
| 1 | Hideo Fujiwara | [1] [2] |
| 2 | Satoshi Ohtake | [1] |
| 3 | Tomokazu Yoneda | [1] [2] |