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Michael S. Hsiao Vis

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*2009
120EENannan He, Michael S. Hsiao: An efficient path-oriented bitvector encoding width computation algorithm for bit-precise verification. DATE 2009: 1602-1607
119EEMainak Banga, Michael S. Hsiao: A Novel Sustained Vector Technique for the Detection of Hardware Trojans. VLSI Design 2009: 327-332
2008
118EEYexin Zheng, Michael S. Hsiao, Chao Huang: SAT-based equivalence checking of threshold logic designs for nanotechnologies. ACM Great Lakes Symposium on VLSI 2008: 225-230
117EEMainak Banga, Maheshwar Chandrasekar, Lei Fang, Michael S. Hsiao: Guided test generation for isolation and detection of embedded trojans in ics. ACM Great Lakes Symposium on VLSI 2008: 363-366
116EELei Fang, Michael S. Hsiao: A Fast Approximation Algorithm for MIN-ONE SAT. DATE 2008: 1087-1090
115EEWeixin Wu, Michael S. Hsiao: Efficient Design Validation Based on Cultural Algorithms. DATE 2008: 402-407
114EEXueqi Cheng, Michael S. Hsiao: Simulation-Directed Invariant Mining for Software Verification. DATE 2008: 682-687
113EEMainak Banga, Michael S. Hsiao: A Region Based Approach for the Identification of Hardware Trojans. HOST 2008: 40-47
112EEXueqi Cheng, Michael S. Hsiao: Ant Colony Optimization directed program abstraction for software bounded model checking. ICCD 2008: 46-51
111EEShrirang M. Yardi, Michael S. Hsiao: Quantifying the energy efficiency of coordinated micro-architectural adaptation for multimedia workloads. ICCD 2008: 583-590
110 Karthik Channakeshava, Kaigui Bian, Michael S. Hsiao, Jung Min Park, Robert E. Crossler, France Belanger, Payal Aggarwal, Janine Hiller: On Providing Automatic Parental Consent over Information Collection from Children. Security and Management 2008: 196-202
109EEMichael S. Hsiao, Robert B. Jones: Introduction to special section on high-level design, validation, and test. ACM Trans. Design Autom. Electr. Syst. 13(1): (2008)
108EEWeixin Wu, Michael S. Hsiao: Mining Global Constraints With Domain Knowledge for Improving Bounded Sequential Equivalence Checking. IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 197-201 (2008)
107EELei Fang, Michael S. Hsiao: Bilateral Testing of Nano-scale Fault-Tolerant Circuits. J. Electronic Testing 24(1-3): 285-296 (2008)
106EEHong-Sik Kim, Sungho Kang, Michael S. Hsiao: A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. J. Electronic Testing 24(4): 365-378 (2008)
2007
105EELei Fang, Michael S. Hsiao: A new hybrid solution to boost SAT solver performance. DATE 2007: 1307-1313
104EENannan He, Michael S. Hsiao: Bounded model checking of embedded software in wireless cognitive radio systems. ICCD 2007: 19-24
103EEVishnu C. Vimjam, Michael S. Hsiao: Explicit Safety Property Strengthening in SAT-based Induction. VLSI Design 2007: 63-68
102EEVishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang: Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. VTS 2007: 231-238
101EEXiaoding Chen, Michael S. Hsiao: An Overlapping Scan Architecture for Reducing Both Test Time and Test Power by Pipelining Fault Detection. IEEE Trans. VLSI Syst. 15(4): 404-412 (2007)
2006
100EEVishnu C. Vimjam, Michael S. Hsiao: Fast illegal state identification for improving SAT-based induction. DAC 2006: 241-246
99EEWeixin Wu, Michael S. Hsiao: Mining global constraints for improving bounded sequential equivalence checking. DAC 2006: 743-748
98EELei Fang, Michael S. Hsiao: Bilateral Testing of Nano-scale Fault-tolerant Circuits. DFT 2006: 309-317
97EEKameshwar Chandrasekar, Michael S. Hsiao: Implicit Search-Space Aware Cofactor Expansion: A Novel Preimage Computation Technique. ICCD 2006
96EEVishnu C. Vimjam, Michael S. Hsiao: Efficient Fault Collapsing via Generalized Dominance Relations. VTS 2006: 258-265
95EEQingwei Wu, Michael S. Hsiao: A New Simulation-Based Property Checking Algorithm Based on Partitioned Alternative Search Space Traversal. IEEE Trans. Computers 55(11): 1325-1334 (2006)
94EEXiaoding Chen, Michael S. Hsiao: Testing Embedded Sequential Cores in Parallel Using Spectrum-Based BIST. IEEE Trans. Computers 55(2): 150-162 (2006)
93EEQingwei Wu, Michael S. Hsiao: State Variable Extraction and Partitioning to Reduce Problem Complexity for ATPG and Design Validation. IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2275-2282 (2006)
92EELiang Zhang, Indradeep Ghosh, Michael S. Hsiao: A Framework for Automatic Design Validation of RTL Circuits Using ATPG and Observability-Enhanced Tag Coverage. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2526-2538 (2006)
91EEManan Syal, Michael S. Hsiao: New techniques for untestable fault identification in sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1117-1131 (2006)
2005
90EEVishnu C. Vimjam, Manan Syal, Michael S. Hsiao: Untestable fault identification through enhanced necessary value assignments. ACM Great Lakes Symposium on VLSI 2005: 176-181
89EERonald P. Lajaunie, Michael S. Hsiao: An effective and efficient ATPG-based combinational equivalence checker. ACM Great Lakes Symposium on VLSI 2005: 248-253
88EEKameshwar Chandrasekar, Michael S. Hsiao: Forward image computation with backtracing ATPG and incremental state-set construction. ACM Great Lakes Symposium on VLSI 2005: 254-259
87EEManan Syal, Michael S. Hsiao, Suriyaprakash Natarajan, Sreejit Chakravarty: Untestable Multi-Cycle Path Delay Faults in Industrial Designs. Asian Test Symposium 2005: 194-201
86EELiang Zhang, Mukul R. Prasad, Michael S. Hsiao: Interleaved Invariant Checking with Dynamic Abstraction. CHARME 2005: 81-96
85EELiang Zhang, Mukul R. Prasad, Michael S. Hsiao, Thomas Sidle: Dynamic abstraction using SAT-based BMC. DAC 2005: 754-757
84EEKameshwar Chandrasekar, Michael S. Hsiao: Integration of Learning Techniques into Incremental Satisfiability for Efficient Path-Delay Fault Test Generation. DATE 2005: 1002-1007
83EEShrirang M. Yardi, Michael S. Hsiao, Thomas L. Martin, Dong S. Ha: Quality-Driven Proactive Computation Elimination for Power-Aware Multimedia Processing. DATE 2005: 340-345
82EEShrirang M. Yardi, Karthik Channakeshava, Michael S. Hsiao, Thomas L. Martin, Dong S. Ha: A Formal Framework for Modeling and Analysis of System-Level Dynamic Power Management. ICCD 2005: 119-126
81EEManan Syal, Rajat Arora, Michael S. Hsiao: Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults. ICCD 2005: 453-460
80EEKameshwar Chandrasekar, Michael S. Hsiao: State Set Management for SAT-based Unbounded Model Checking. ICCD 2005: 585-590
79EEXueqi Cheng, Michael S. Hsiao: Region-level approximate computation reuse for power reduction in multimedia applications. ISLPED 2005: 119-122
78EEDaniel C. Nash, Thomas L. Martin, Dong S. Ha, Michael S. Hsiao: Towards an Intrusion Detection System for Battery Exhaustion Attacks on Mobile Computing Devices. PerCom Workshops 2005: 141-145
77EEKameshwar Chandrasekar, Michael S. Hsiao: Q-PREZ: QBF Evaluation Using Partition, Resolution and Elimination with ZBDDs. VLSI Design 2005: 189-194
76EEXiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran: Efficient techniques for transition testing. ACM Trans. Design Autom. Electr. Syst. 10(2): 258-278 (2005)
75EEXiao Liu, Michael S. Hsiao: A Novel Transition Fault ATPG That Reduces Yield Loss. IEEE Design & Test of Computers 22(6): 576-584 (2005)
74EEAnand L. D'Souza, Michael S. Hsiao: Error Diagnosis of Sequential Circuits Using Region-Based Model. J. Electronic Testing 21(2): 115-126 (2005)
2004
73EEBin Li, Michael S. Hsiao, Shuo Sheng: A Novel SAT All-Solutions Solver for Efficient Preimage Computation. DATE 2004: 272-279
72EELiang Zhang, Mukul R. Prasad, Michael S. Hsiao: Incremental deductive & inductive reasoning for SAT-based bounded model checking. ICCAD 2004: 502-509
71EEManan Syal, Michael S. Hsiao, Sreejit Chakravarty: Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks. ITC 2004: 1034-1043
70EEPuneet Gupta, Michael S. Hsiao: ALAPTF: A new Transition Faultmodel and the ATPG Algorithm. ITC 2004: 1053-1060
69EEKameshwar Chandrasekar, Michael S. Hsiao: Decision Selection and Learning for an All-Solutions ATPG Engine. ITC 2004: 607-616
68EEQingwei Wu, Michael S. Hsiao: State Variable Extraction to Reduce Problem Complexity for ATPG and Design Validation. ITC 2004: 820-829
67EEThomas L. Martin, Michael S. Hsiao, Dong S. Ha, Jayan Krishnaswami: Denial-of-Service Attacks on Battery-powered Mobile Computers. PerCom 2004: 309-318
66EEManan Syal, Michael S. Hsiao: Untestable Fault Identification using Recurrence Relations and Impossible Value Assignments. VLSI Design 2004: 481-486
65EEMukul R. Prasad, Michael S. Hsiao, Jawahar Jain: Can SAT be used to Improve Sequential ATPG Methods? VLSI Design 2004: 585-
64EERajat Arora, Michael S. Hsiao: Enhancing SAT-based Bounded Model Checking using Sequential Logic Implications. VLSI Design 2004: 784-787
63EEQingwei Wu, Michael S. Hsiao: Efficient ATPG for Design Validation Based On Partitioned State Exploration Histories. VTS 2004: 389-405
62EEShuo Sheng, Michael S. Hsiao: Success-Driven Learning in ATPG for Preimage Computation. IEEE Design & Test of Computers 21(6): 504-512 (2004)
61EERajat Arora, Michael S. Hsiao: Using Global Structural Relationships of Signals to Accelerate SAT-based Combinational Equivalence Checking. J. UCS 10(12): 1597-1628 (2004)
2003
60EELiang Zhang, Michael S. Hsiao, Indradeep Ghosh: Automatic Design Validation Framework for HDL Descriptions via RTL ATPG. Asian Test Symposium 2003: 148-153
59EEManan Syal, Michael S. Hsiao: A Novel, Low-Cost Algorithm for Sequentially Untestable Fault Identification. DATE 2003: 10316-10321
58EEShuo Sheng, Michael S. Hsiao: Efficient Preimage Computation Using A Novel Success-Driven ATPG. DATE 2003: 10822-10827
57EEXiao Liu, Michael S. Hsiao: Constrained ATPG for Broadside Transition Testing. DFT 2003: 175-
56EEQingwei Wu, Michael S. Hsiao: Efficient Sequential ATPG Based on Partitioned Finite-State-Machine Traversal. ITC 2003: 281-289
55EELiang Zhang, Indradeep Ghosh, Michael S. Hsiao: Efficient Sequential ATPG for Functional RTL Circuits. ITC 2003: 290-298
54EEPuneet Gupta, Michael S. Hsiao: High Quality ATPG for Delay Defects. ITC 2003: 584-591
53EEXiaoding Chen, Michael S. Hsiao: Energy-Efficient Logic BIST Based on State Correlation Analysis. VTS 2003: 267-272
52EEManan Syal, Michael S. Hsiao, Kiran B. Doreswamy, Sreejit Chakravarty: Efficient Implication - Based Untestable Bridge Fault Identifier. VTS 2003: 393-402
51EEXiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran: Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors. J. Electronic Testing 19(4): 437-445 (2003)
2002
50EEShuo Sheng, Koichiro Takayama, Michael S. Hsiao: Effective safety property checking using simulation-based sequential ATPG. DAC 2002: 813-818
49EEMichael S. Hsiao: Maximizing Impossibilities for Untestable Fault Identification. DATE 2002: 949-953
48EEXiaoding Chen, Michael S. Hsiao: Characteristic faults and spectral information for logic BIST. ICCAD 2002: 294-298
47EEXiao Liu, Michael S. Hsiao, Sreejit Chakravarty, Paul J. Thadikaran: Techniques to Reduce Data Volume and Application Time for Transition Test. ITC 2002: 983-992
46 Mukul R. Prasad, Michael S. Hsiao, Jawahar Jain: Improving Sequential ATPG Using SAT Methods. IWLS 2002: 79-84
45EEYufeng Zhao, Michael S. Hsiao: Reducing Power Consumption by Utilizing Retransmission in Short Range Wireless Network. LCN 2002: 527-533
44EEPhillip Stanley-Marbell, Michael S. Hsiao, Ulrich Kremer: A Hardware Architecture for Dynamic Performance and Energy Adaptation. PACS 2002: 33-52
43EEGanapathy Kasturirangan, Michael S. Hsiao: Spectrum-Based BIST in Complex SOCs. VTS 2002: 111-116
42EEShuo Sheng, Michael S. Hsiao: Efficient Sequential Test Generation Based on Logic Simulation. IEEE Design & Test of Computers 19(5): 56-64 (2002)
41EEAshish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: State and Fault Information for Compaction-Based Test Generation. J. Electronic Testing 18(1): 63-72 (2002)
40EESandhya Seshadri, Michael S. Hsiao: Behavioral-Level DFT via Formal Operator Testability Measures. J. Electronic Testing 18(6): 595-611 (2002)
2001
39EEAshish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: Efficient spectral techniques for sequential ATPG. DATE 2001: 204-208
38EEPhillip Stanley-Marbell, Michael S. Hsiao: Fast, flexible, cycle-accurate energy estimation. ISLPED 2001: 141-146
37EEChung-Hsing Hsu, Ulrich Kremer, Michael S. Hsiao: Compiler-directed dynamic voltage/frequency scheduling for energy reduction in mircoprocessors. ISLPED 2001: 275-278
36 Nandini Sridhar, Michael S. Hsiao: On efficient error diagnosis of digital circuits. ITC 2001: 678-687
35EEAnand L. D'Souza, Michael S. Hsiao: Error Diagnosis of Sequential Circuits Using Region-Based Mode. VLSI Design 2001: 103-
34EESameer Sharma, Michael S. Hsiao: Combination of Structural and State Analysis for Partial Scan. VLSI Design 2001: 134-
33EENachiketh R. Potlapally, Michael S. Hsiao, Anand Raghunathan, Ganesh Lakshminarayana, Srimat T. Chakradhar: Accurate Power Macro-modeling Techniques for Complex RTL Circuits. VLSI Design 2001: 235-241
32EEAshish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: Novel Spectral Methods for Built-In Self-Test in a System-on-a-Chip Environment. VTS 2001: 163-168
31 Matthew Arnold, Michael S. Hsiao, Ulrich Kremer, Barbara G. Ryder: Exploring the Interaction between Java?s Implicitly Thrown Exceptions and Instruction Scheduling. International Journal of Parallel Programming 29(2): 111-137 (2001)
2000
30EEAshish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: Compaction-based test generation using state and fault information. Asian Test Symposium 2000: 159-164
29EERuofan Xu, Michael S. Hsiao: Embedded core testing using genetic algorithms. Asian Test Symposium 2000: 254-259
28EEKabir Gulrajani, Michael S. Hsiao: Multi-Node Static Logic Implications for Redundancy Identification. DATE 2000: 729-
27EEChung-Hsing Hsu, Ulrich Kremer, Michael S. Hsiao: Compiler-Directed Dynamic Frequency and Voltage Scheduling. PACS 2000: 65-81
26EEAnkur Jain, Vamsi Boppana, Rajarshi Mukherjee, Jawahar Jain, Masahiro Fujita, Michael S. Hsiao: Testing, Verification, and Diagnosis in the Presence of Unknowns. VTS 2000: 263-270
25EEMichael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Dynamic state traversal for sequential circuit test generation. ACM Trans. Design Autom. Electr. Syst. 5(3): 548-565 (2000)
24EEMichael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Peak power estimation of VLSI circuits: new peak power measures. IEEE Trans. VLSI Syst. 8(4): 435-439 (2000)
23EESandhya Seshadri, Michael S. Hsiao: Formal Value-Range and Variable Testability Techniques for High-Level Design-For-Testability. J. Electronic Testing 16(1-2): 131-145 (2000)
22EEMichael S. Hsiao, Srimat T. Chakradhar: Test Set Compaction Using Relaxed Subsequence Removal. J. Electronic Testing 16(4): 319-327 (2000)
21EEMichael S. Hsiao, Srimat T. Chakradhar: Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential Circuits. J. Electronic Testing 16(4): 329-338 (2000)
1999
20EEMichael S. Hsiao: Peak Power Estimation Using Genetic Spot Optimization for Large VLSI Circuits. DATE 1999: 175-
19 Sandhya Seshadri, Michael S. Hsiao: An integrated approach to behavioral-level design-for-testability using value-range and variable testability techniques. ITC 1999: 858-867
18EEMatthew Arnold, Michael S. Hsiao, Ulrich Kremer, Barbara G. Ryder: Instruction Scheduling in the Presence of Java's Runtime Exceptions. LCPC 1999: 18-34
17EESameer Sharma, Michael S. Hsiao: Partial Scan Using Multi-Hop State Reachability Analysis. VTS 1999: 121-127
16EEAnkur Jain, Michael S. Hsiao, Vamsi Boppana, Masahiro Fujita: On the Evaluation of Arbitrary Defect Coverage of Test Sets. VTS 1999: 426-432
15 Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Fast Static Compaction Algorithms for Sequential Circuit Test Vectors. IEEE Trans. Computers 48(3): 311-322 (1999)
14EEMichael S. Hsiao: On Non-Statistical Techniques for Fast Fault Coverage Estimation. J. Electronic Testing 15(3): 239-254 (1999)
1998
13EEMichael S. Hsiao, Srimat T. Chakradhar: Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits. Asian Test Symposium 1998: 452-457
12EEMichael S. Hsiao, Srimat T. Chakradhar: State Relaxation Based Subsequence Removal for Fast Static Compaction in Sequential Circuits. DATE 1998: 577-582
11EEMichael S. Hsiao: A fast, accurate, and non-statistical method for fault coverage estimation. ICCAD 1998: 155-161
10EEMichael S. Hsiao, Gurjeet S. Saund, Elizabeth M. Rudnick, Janak H. Patel: Partial Scan Selection Based on Dynamic Reachability and Observability Information. VLSI Design 1998: 174-180
9EEMichael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Application of genetically engineered finite-state-machine sequences to sequential circuit ATPG. IEEE Trans. on CAD of Integrated Circuits and Systems 17(3): 239-254 (1998)
1997
8EEMichael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Sequential circuit test generation using dynamic state traversal. ED&TC 1997: 22-28
7 Gurjeet S. Saund, Michael S. Hsiao, Janak H. Patel: Partial Scan beyond Cycle Cutting. FTCS 1997: 320-328
6EEMichael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Effects of delay models on peak power estimation of VLSI sequential circuits. ICCAD 1997: 45-51
5EEMichael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: K2: an estimator for peak sustainable power of VLSI circuits. ISLPED 1997: 178-183
4EEDilip Krishnaswamy, Michael S. Hsiao, Vikram Saxena, Elizabeth M. Rudnick, Janak H. Patel, Prithviraj Banerjee: Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation. VLSI Design 1997: 475-481
3EEMichael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors. VTS 1997: 188-195
1996
2EEMichael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel: Automatic test generation using genetically-engineered distinguishing sequences. VTS 1996: 216-223
1995
1EEMichael S. Hsiao, Janak H. Patel: A new architectural-level fault simulation using propagation prediction of grouped fault-effects. ICCD 1995: 628-

Coauthor Index

1Payal Aggarwal [110]
2Vishwani D. Agrawal [30] [32] [39] [41]
3Enamul Amyeen [102]
4Matthew Arnold [18] [31]
5Rajat Arora [61] [64] [81]
6Prithviraj Banerjee (Prith Banerjee) [4]
7Mainak Banga [113] [117] [119]
8France Belanger [110]
9Kaigui Bian [110]
10Vamsi Boppana [16] [26]
11Srimat T. Chakradhar [12] [13] [21] [22] [33]
12Sreejit Chakravarty [47] [51] [52] [71] [76] [87]
13Kameshwar Chandrasekar [69] [77] [80] [84] [88] [97]
14Maheshwar Chandrasekar [117]
15Karthik Channakeshava [82] [110]
16Xiaoding Chen [48] [53] [94] [101]
17Xueqi Cheng [79] [112] [114]
18Robert E. Crossler [110]
19Anand L. D'Souza [35] [74]
20Kiran B. Doreswamy [52]
21Lei Fang [98] [105] [107] [116] [117]
22Masahiro Fujita [16] [26]
23Indradeep Ghosh [55] [60] [92]
24Ashish Giani [30] [32] [39] [41]
25Kabir Gulrajani [28]
26Ruifeng Guo [102]
27Puneet Gupta [54] [70]
28Dong S. Ha [67] [78] [82] [83]
29Nannan He [104] [120]
30Janine Hiller [110]
31Chung-Hsing Hsu [27] [37]
32Chao Huang [118]
33Ankur Jain [16] [26]
34Jawahar Jain [26] [46] [65]
35Robert B. Jones [109]
36Sungho Kang [106]
37Ganapathy Kasturirangan [43]
38Hong-Sik Kim [106]
39Ulrich Kremer [18] [27] [31] [37] [44]
40Jayan Krishnaswami [67]
41Dilip Krishnaswamy [4]
42Ronald P. Lajaunie [89]
43Ganesh Lakshminarayana [33]
44Bin Li [73]
45Xiao Liu [47] [51] [57] [75] [76]
46Thomas L. Martin [67] [78] [82] [83]
47Rajarshi Mukherjee [26]
48Daniel C. Nash [78]
49Suriyaprakash Natarajan [87]
50Jung Min Park [110]
51Janak H. Patel [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [15] [24] [25]
52Nachiketh R. Potlapally [33]
53Mukul R. Prasad [46] [65] [72] [85] [86]
54Anand Raghunathan [33]
55Elizabeth M. Rudnick [2] [3] [4] [5] [6] [8] [9] [10] [15] [24] [25]
56Barbara G. Ryder [18] [31]
57Gurjeet S. Saund [7] [10]
58Vikram Saxena [4]
59Sandhya Seshadri [19] [23] [40]
60Sameer Sharma [17] [34]
61Shuo Sheng [30] [32] [39] [41] [42] [50] [58] [62] [73]
62Thomas Sidle [85]
63Nandini Sridhar [36]
64Phillip Stanley-Marbell [38] [44]
65Manan Syal [52] [59] [66] [71] [81] [87] [90] [91]
66Koichiro Takayama [50]
67Paul J. Thadikaran [47] [51] [76]
68Srikanth Venkataraman [102]
69Vishnu C. Vimjam [90] [96] [100] [102] [103]
70Qingwei Wu [56] [63] [68] [93] [95]
71Weixin Wu [99] [108] [115]
72Ruofan Xu [29]
73Kai Yang [102]
74Shrirang M. Yardi [82] [83] [111]
75Liang Zhang [55] [60] [72] [85] [86] [92]
76Yufeng Zhao [45]
77Yexin Zheng [118]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)