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Yasuhiko Hara Vis

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*1998
4EEHilário Haruomi Kobayashi, Yasuhiko Hara, Hideaki Doi, Kazuo Takai, Akiyoshi Sumiya: Hybrid Defect Detection Method Based on Shape Measurement and Feature Extraction for Complex Patterns. MVA 1998: 177-182
1995
3EEHideaki Doi, Yoko Suzuki, Yasuhiko Hara, Tadashi Iida, Yasuhiro Fujishita, Koichi Karasaki: Real-Time X-Ray Inspection of 3D Defects in Circuit Board Patterns. ICCV 1995: 575-582
1992
2EEHideaki Doi, Yasuhiko Hara, Koichi Karasaki, Tadashi Iida, Takashi Furutani, Shigeki Kitamura, Norihiro Minatani, Satashi Shinada: Automated Inspection of Printed Circuit Board Patterns Referenced to CAD Data. MVA 1992: 419-4284
1988
1EEYasuhiko Hara, Hideaki Doi, Koichi Karasaki, Tadashi Iida: A System for PCB Automated Inspection Using Fluorescent Light. IEEE Trans. Pattern Anal. Mach. Intell. 10(1): 69-78 (1988)

Coauthor Index

1Hideaki Doi [1] [2] [3] [4]
2Yasuhiro Fujishita [3]
3Takashi Furutani [2]
4Tadashi Iida [1] [2] [3]
5Koichi Karasaki [1] [2] [3]
6Shigeki Kitamura [2]
7Hilário Haruomi Kobayashi [4]
8Norihiro Minatani [2]
9Satashi Shinada [2]
10Akiyoshi Sumiya [4]
11Yoko Suzuki [3]
12Kazuo Takai [4]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)