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Themistoklis Haniotakis

Th. Haniotakis

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2007
29EEMichael N. Skoufis, Haibo Wang, Themistoklis Haniotakis, Spyros Tragoudas: Glitch Control with Dynamic Receiver Threshold Adjustment. ISQED 2007: 410-415
28EEDimitri Kagaris, Themistoklis Haniotakis: Transistor-Level Synthesis for Low-Power Applications. ISQED 2007: 607-612
27EEThemistoklis Haniotakis, Y. Tsiatouhas, Dimitris Nikolos, Costas Efstathiou: Testable Designs of Multiple Precharged Domino Circuits. IEEE Trans. VLSI Syst. 15(4): 461-465 (2007)
26EEDimitrios Kagaris, Themistoklis Haniotakis: A Methodology for Transistor-Efficient Supergate Design. IEEE Trans. VLSI Syst. 15(4): 488-492 (2007)
2006
25EEEdward Flanigan, Themistoklis Haniotakis, Spyros Tragoudas: An Improved Method for Identifying Linear Dependencies in Path Delay Faults. ISQED 2006: 457-462
24EEDimitri Kagaris, Themistoklis Haniotakis: Transistor-Level Optimization of Supergates. ISQED 2006: 682-690
2005
23EES. Matakias, Y. Tsiatouhas, Themistoklis Haniotakis, Angela Arapoyanni, Aristides Efthymiou: Fast, Parallel Two-Rail Code Checker with Enhanced Testability. IOLTS 2005: 149-156
22EEKhadija Stewart, Themistoklis Haniotakis, Spyros Tragoudas: Design and Evaluation of a Security Scheme for Sensor Networks. ISQED 2005: 197-201
21EEThemistoklis Haniotakis, Spyros Tragoudas, G. Pani: Reduced Test Application Time Based on Reachability Analysis. ISQED 2005: 232-237
20EEA. Rao, Th. Haniotakis, Y. Tsiatouhas, H. Djemil: The Use of Pre-Evaluation Phase in Dynamic CMOS Logic. ISVLSI 2005: 270-271
2004
19EEA. Rao, Th. Haniotakis, Y. Tsiatouhas, V. Kaky: A New Dynamic Circuit Design Technique for High Performance TSC Checker Implementations. IOLTS 2004: 52-57
18EES. Matakias, Y. Tsiatouhas, Th. Haniotakis, Angela Arapoyanni: Ultra Fast and Low Cost Parallel Two-Rail Code Checker Targeting High Fan-In Applications . ISVLSI 2004: 293-296
17EEMaria K. Michael, Themistoklis Haniotakis, Spyros Tragoudas: A unified framework for generating all propagation functions for logic errors and events. IEEE Trans. on CAD of Integrated Circuits and Systems 23(6): 980-986 (2004)
2003
16EEY. Tsiatouhas, S. Matakias, Angela Arapoyanni, Th. Haniotakis: A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs. IOLTS 2003: 12-16
15EEY. Tsiatouhas, Th. Haniotakis, Angela Arapoyanni: An Embedded IDDQ Testing Architecture and Technique. ISQED 2003: 442-
2002
14EEY. Tsiatouhas, Angela Arapoyanni, Dimitris Nikolos, Th. Haniotakis: A Hierarchical Architecture for Concurrent Soft Error Detection Based on Current Sensing. IOLTW 2002: 56-60
13EEA. Chrisanthopoulos, Y. Tsiatouhas, Angela Arapoyanni, Themistoklis Haniotakis: SRAM oriented memory sense amplifier design in 0.18 /spl mu/m CMOS technology. ISCAS (5) 2002: 145-148
12EEY. Tsiatouhas, Th. Haniotakis, Dimitris Nikolos, Angela Arapoyanni: Extending the Viability of IDDQ Testing in the Deep Submicron Era. ISQED 2002: 100-105
11EEY. Tsiatouhas, Yiannis Moisiadis, Th. Haniotakis, Dimitris Nikolos, Angela Arapoyanni: A new technique for IDDQ testing in nanometer technologies. Integration 31(2): 183-194 (2002)
2001
10EEY. Tsiatouhas, Th. Haniotakis, Dimitris Nikolos, Costas Efstathiou: Concurrent Detection of Soft Errors Based on Current Monitoring. IOLTW 2001: 106-110
2000
9EEY. Tsiatouhas, Th. Haniotakis, Angela Arapoyanni, Dimitris Nikolos: A Versatile Built-In Self-Test Scheme for Delay Fault Testing. DATE 2000: 756
8EEY. Tsiatouhas, Th. Haniotakis, Dimitris Nikolos: A Compact Built-In Current Sensor for IDDQ Testing. IOLTW 2000: 95-99
7EETh. Haniotakis, Y. Tsiatouhas, Dimitris Nikolos, Costas Efstathiou: On Testability of Multiple Precharged Domino Logic. ISQED 2000: 299-304
1999
6EEDimitris Nikolos, Haridimos T. Vergos, Th. Haniotakis, Y. Tsiatouhas: Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks. DATE 1999: 112-116
5EEY. Tsiatouhas, Th. Haniotakis: A Zero Aliasing Built-In Self Test Technique for Delay Fault Testing. DFT 1999: 95-100
4EEHaridimos T. Vergos, Dimitris Nikolos, Y. Tsiatouhas, Th. Haniotakis, Michael Nicolaidis: On Path Delay Fault Testing of Multiplexer - Based Shifters. Great Lakes Symposium on VLSI 1999: 20-23
1998
3EETh. Haniotakis, Dimitris Nikolos, Y. Tsiatouhas: C-Testable One-Dimensional ILAs with Respect to Path Delay Faults: Theory and Applications. DFT 1998: 155-163
1995
2EEIoannis Voyiatzis, Dimitris Nikolos, Antonis M. Paschalis, Constantinos Halatsis, Th. Haniotakis: An efficient comparative concurrent Built-In Self-Test technique. Asian Test Symposium 1995: 309-315
1 Th. Haniotakis, Antonis M. Paschalis, Dimitris Nikolos: Efficient Totally Self-Checking Checkers for a Class of Borden Codes. IEEE Trans. Computers 44(11): 1318-1322 (1995)

Coauthor Index

1Angela Arapoyanni [9] [11] [12] [13] [14] [15] [16] [18] [23]
2A. Chrisanthopoulos [13]
3H. Djemil [20]
4Costas Efstathiou [7] [10] [27]
5Aristides Efthymiou [23]
6Edward Flanigan [25]
7Constantin Halatsis (Constantine Halatsis, Constantinos Halatsis) [2]
8Dimitrios Kagaris (Dimitri Kagaris) [24] [26] [28]
9V. Kaky [19]
10S. Matakias [16] [18] [23]
11Maria K. Michael [17]
12Yiannis Moisiadis [11]
13Michael Nicolaidis [4]
14Dimitris Nikolos [1] [2] [3] [4] [6] [7] [8] [9] [10] [11] [12] [14] [27]
15G. Pani [21]
16Antonis M. Paschalis [1] [2]
17A. Rao [19] [20]
18Michael N. Skoufis [29]
19Khadija Stewart [22]
20Spyros Tragoudas [17] [21] [22] [25] [29]
21Y. Tsiatouhas [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [18] [19] [20] [23] [27]
22Haridimos T. Vergos [4] [6]
23Ioannis Voyiatzis [2]
24Haibo Wang [29]

Copyright © Thu Jun 5 07:42:39 2008 by Michael Ley (ley@uni-trier.de)