Vijayram Gopu
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2004
1
EE
Patrick J. Schroeder
,
Pankaj Bolaki
, Vijayram Gopu: Comparing the Fault Detection Effectiveness of N-way and Random Test Suites.
ISESE 2004
: 49-59
Coauthor Index
1
Pankaj Bolaki
[
1
]
2
Patrick J. Schroeder
[
1
]
Copyright ©
Tue Nov 3 08:52:44 2009 by
Michael Ley
(
ley@uni-trier.de
)
