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| * | 2005 | |
|---|---|---|
| 1 | EE | Enjun Xiao, P. P. Ghosh, C. Yu, J. S. Yuan: Hot carrier and soft breakdown effects on LNA performance for ultra wideband communications. Microelectronics Reliability 45(9-11): 1382-1385 (2005) |
| 1 | Enjun Xiao | [1] |
| 2 | C. Yu | [1] |
| 3 | J. S. Yuan | [1] |