| * | 2009 |
|---|
| 9 | EE | Kunal P. Ganeshpure,
Ilia Polian,
Sandip Kundu,
Bernd Becker:
Reducing temperature variability by routing heat pipes.
ACM Great Lakes Symposium on VLSI 2009: 63-68 |
| 8 | EE | Kunal P. Ganeshpure,
Sandip Kundu:
An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays.
VLSI Design 2009: 233-238 |
| 7 | EE | Alodeep Sanyal,
Kunal P. Ganeshpure,
Sandip Kundu:
An Improved Soft-Error Rate Measurement Technique.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(4): 596-600 (2009) |
| 2008 |
|---|
| 6 | EE | Ashesh Rastogi,
Kunal P. Ganeshpure,
Alodeep Sanyal,
Sandip Kundu:
On Composite Leakage Current Maximization.
J. Electronic Testing 24(4): 405-420 (2008) |
| 2007 |
|---|
| 5 | EE | Kunal P. Ganeshpure,
Sandip Kundu:
Interactive presentation: Automatic test pattern generation for maximal circuit noise in multiple aggressor crosstalk faults.
DATE 2007: 540-545 |
| 4 | EE | Alodeep Sanyal,
Kunal P. Ganeshpure,
Sandip Kundu:
Accelerating Soft Error Rate Testing Through Pattern Selection.
IOLTS 2007: 191-193 |
| 3 | EE | Ashesh Rastogi,
Kunal P. Ganeshpure,
Sandip Kundu:
A Study on Impact of Leakage Current on Dynamic Power.
ISCAS 2007: 1069-1072 |
| 2 | EE | Alodeep Sanyal,
Kunal P. Ganeshpure,
Sandip Kundu:
On Accelerating Soft-Error Detection by Targeted Pattern Generation.
ISQED 2007: 723-728 |
| 2006 |
|---|
| 1 | EE | Kunal P. Ganeshpure,
Alodeep Sanyal,
Sandip Kundu:
A Pattern Generation Technique for Maximizing Power Supply Currents.
ICCD 2006 |
