| |
| 2007 | ||
|---|---|---|
| 4 | EE | Rajesh Galivanche, Rohit Kapur, Antonio Rubio: Testing in the year 2020. DATE 2007: 960-965 |
| 2006 | ||
| 3 | EE | Rajesh Galivanche, Bob Gottlieb: Session Abstract. VTS 2006: 422-423 |
| 2004 | ||
| 2 | EE | Sandip Kundu, T. M. Mak, Rajesh Galivanche: Trends in manufacturing test methods and their implications. ITC 2004: 679-687 |
| 2003 | ||
| 1 | EE | Bill Grundmann, Rajesh Galivanche, Sandip Kundu: Circuit and Platform Design Challenges in Technologies beyond 90nm. DATE 2003: 10044-10049 |
| 1 | Bob Gottlieb | [3] |
| 2 | Bill Grundmann | [1] |
| 3 | Rohit Kapur | [4] |
| 4 | Sandip Kundu | [1] [2] |
| 5 | T. M. Mak | [2] |
| 6 | Antonio Rubio | [4] |