Andy S. F. Fung
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1981
1
Vinod K. Agarwal
, Andy S. F. Fung: Multiple Fault Testing of Large Circuits by Single Fault Test Sets.
IEEE Trans. Computers 30
(11): 855-865 (1981)
Coauthor Index
1
Vinod K. Agarwal
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1
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Copyright ©
Tue Nov 3 08:52:44 2009 by
Michael Ley
(
ley@uni-trier.de
)
