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Antoine Fuentes Vis

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*1990
2 René David, Antoine Fuentes: Fault Diagnosis of RAM's from Random Testing Experiments. IEEE Trans. Computers 39(2): 220-229 (1990)
1989
1 René David, Antoine Fuentes, Bernard Courtois: Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989)

Coauthor Index

1Bernard Courtois [1]
2René David [1] [2]

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