| 2008 |
| 12 | EE | Stefan Spinner,
Ilia Polian,
Piet Engelke,
Bernd Becker,
Martin Keim,
Wu-Tung Cheng:
Automatic Test Pattern Generation for Interconnect Open Defects.
VTS 2008: 181-186 |
| 11 | EE | Piet Engelke,
Ilia Polian,
Michel Renovell,
Sandip Kundu,
Bharath Seshadri,
Bernd Becker:
On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(2): 327-338 (2008) |
| 2006 |
| 10 | EE | Yuyi Tang,
Hans-Joachim Wunderlich,
Piet Engelke,
Ilia Polian,
Bernd Becker,
Jürgen Schlöffel,
Friedrich Hapke,
Michael Wittke:
X-masking during logic BIST and its impact on defect coverage.
IEEE Trans. VLSI Syst. 14(2): 193-202 (2006) |
| 9 | EE | Piet Engelke,
Ilia Polian,
Michel Renovell,
Bernd Becker:
Simulating Resistive-Bridging and Stuck-At Faults.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2181-2192 (2006) |
| 8 | EE | Piet Engelke,
Ilia Polian,
Michel Renovell,
Bernd Becker:
Automatic Test Pattern Generation for Resistive Bridging Faults.
J. Electronic Testing 22(1): 61-69 (2006) |
| 2005 |
| 7 | EE | Sandip Kundu,
Piet Engelke,
Ilia Polian,
Bernd Becker:
On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing.
Asian Test Symposium 2005: 266-271 |
| 6 | EE | Ilia Polian,
Sandip Kundu,
Jean Marc Galliere,
Piet Engelke,
Michel Renovell,
Bernd Becker:
Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies.
VTS 2005: 343-348 |
| 5 | EE | Ilia Polian,
Piet Engelke,
Michel Renovell,
Bernd Becker:
Modeling Feedback Bridging Faults with Non-Zero Resistance.
J. Electronic Testing 21(1): 57-69 (2005) |
| 2004 |
| 4 | EE | Yuyi Tang,
Hans-Joachim Wunderlich,
Harald P. E. Vranken,
Friedrich Hapke,
Michael Wittke,
Piet Engelke,
Ilia Polian,
Bernd Becker:
X-Masking During Logic BIST and Its Impact on Defect Coverage.
ITC 2004: 442-451 |
| 3 | EE | Piet Engelke,
Ilia Polian,
Michel Renovell,
Bharath Seshadri,
Bernd Becker:
The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults.
VTS 2004: 171-178 |
| 2003 |
| 2 | EE | Piet Engelke,
Ilia Polian,
Michel Renovell,
Bernd Becker:
Simulating Resistive Bridging and Stuck-At Faults.
ITC 2003: 1051-1059 |
| 2002 |
| 1 | EE | Ilia Polian,
Piet Engelke,
Bernd Becker:
Efficient Bridging Fault Simulation of Sequential Circuits Based on Multi-Valued Logics.
ISMVL 2002: 216- |