| |
| * | 2009 | |
|---|---|---|
| 1 | EE | Pilsung Kang, Hyoungjoo Lee, Sungzoon Cho, Dongil Kim, Jinwoo Park, Chan-Kyoo Park, Seungyong Doh: A virtual metrology system for semiconductor manufacturing. Expert Syst. Appl. 36(10): 12554-12561 (2009) |
| 1 | Sungzoon Cho | [1] |
| 2 | Pilsung Kang | [1] |
| 3 | Dongil Kim | [1] |
| 4 | Hyoungjoo Lee | [1] |
| 5 | Chan-Kyoo Park | [1] |
| 6 | Jinwoo Park | [1] |