| 2008 |
|---|
| 59 | EE | Scott Davidson:
How to make your own processor architecture.
IEEE Design & Test of Computers 25(1): 96-98 (2008) |
| 58 | EE | Scott Davidson,
Nur A. Touba:
Guest Editors' Introduction: Progress in Test Compression.
IEEE Design & Test of Computers 25(2): 112-113 (2008) |
| 57 | EE | Scott Davidson:
The commonality of vector generation techniques.
IEEE Design & Test of Computers 25(2): 200 (2008) |
| 2007 |
|---|
| 56 | EE | Scott Davidson:
A laboratory right under your nose.
IEEE Design & Test of Computers 24(1): 104 (2007) |
| 55 | EE | Scott Davidson:
A textbook with two target audiences.
IEEE Design & Test of Computers 24(2): 198-199 (2007) |
| 54 | EE | Scott Davidson:
Losing control.
IEEE Design & Test of Computers 24(2): 208 (2007) |
| 53 | EE | Scott Davidson:
How do we train today's students to become tomorrow's engineers?
IEEE Design & Test of Computers 24(4): 408 (2007) |
| 52 | EE | Scott Davidson,
Helen Davidson:
The Psychology of Electronic Test.
IEEE Design & Test of Computers 24(5): 494-501 (2007) |
| 51 | EE | Scott Davidson:
Book Reviews: Test Tutorials in Book Form.
IEEE Design & Test of Computers 24(5): 506-507 (2007) |
| 2006 |
|---|
| 50 | EE | Scott Davidson:
Searching for clues: Diagnosing IC failures.
IEEE Design & Test of Computers 23(1): 67-68 (2006) |
| 49 | EE | Scott Davidson:
All about getting it.
IEEE Design & Test of Computers 23(1): 80 (2006) |
| 48 | EE | Scott Davidson:
An insider's look at microprocessor design.
IEEE Design & Test of Computers 23(2): 162-163 (2006) |
| 47 | EE | Scott Davidson:
Who Reads This Stuff Anyway?
IEEE Design & Test of Computers 23(4): 328 (2006) |
| 46 | EE | Scott Davidson:
Book Reviews: A Comprehensive EDA Handbook.
IEEE Design & Test of Computers 23(5): 426-427 (2006) |
| 2005 |
|---|
| 45 | EE | Scott Davidson:
Towards an Understanding of No Trouble Found Devices.
VTS 2005: 147-152 |
| 44 | EE | Scott Davidson:
Testing: It's not just pass/fail anymore.
IEEE Design & Test of Computers 22(1): 80 (2005) |
| 43 | EE | Scott Davidson:
BIST the hard way.
IEEE Design & Test of Computers 22(4): 386-387 (2005) |
| 42 | EE | Scott Davidson:
What's the problem?
IEEE Design & Test of Computers 22(4): 392 (2005) |
| 41 | EE | Scott Davidson:
Guest Editor's Introduction: ITC Examines How Test Helps the Fittest Survive.
IEEE Design & Test of Computers 22(6): 565 (2005) |
| 2004 |
|---|
| 40 | | Scott Davidson:
Paperless Design and Test.
IEEE Design & Test of Computers 21(1): 72- (2004) |
| 39 | EE | Scott Davidson:
A practical look at ATPG.
IEEE Design & Test of Computers 21(5): 448-449 (2004) |
| 38 | EE | Scott Davidson:
Open-source hardware.
IEEE Design & Test of Computers 21(5): 456- (2004) |
| 37 | EE | Scott Davidson:
Design illiteracy.
IEEE Design & Test of Computers 21(6): 608 (2004) |
| 2003 |
|---|
| 36 | EE | Michael G. Wahl,
Sudipta Bhawmik,
Kamran Zarrineh,
Pradipta Ghosh,
Scott Davidson,
Peter Harrod:
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data.
ITC 2003: 998-1007 |
| 35 | | Scott Davidson:
All I Know I Learned at ITC.
IEEE Design & Test of Computers 20(5): 104- (2003) |
| 2002 |
|---|
| 34 | EE | Scott Davidson:
What Can IC Test Teach System Test?
ITC 2002: 1187 |
| 33 | EE | Ramesh C. Tekumalla,
Scott Davidson:
On Identifying Indistinguishable Path Delay Faults and Improving Diagnosis.
ITC 2002: 993-1002 |
| 32 | EE | Scott Davidson:
Fast Generation of an Alkane-Series Dictionary Ordered by Side-Chain Complexity.
Journal of Chemical Information and Computer Sciences 42(2): 147-156 (2002) |
| 2001 |
|---|
| 31 | EE | Magdy S. Abadir,
Scott Davidson,
Vijay Nagasamy,
Dhiraj K. Pradhan,
Prab Varma:
ATPG for Design Errors-Is It Possible?
VTS 2001: 283-285 |
| 30 | EE | Chao-Wen Tseng,
Subhasish Mitra,
Edward J. McCluskey,
Scott Davidson:
An Evaluation of Pseudo Random Testing for Detecting Real Defects.
VTS 2001: 404-410 |
| 29 | | Scott Davidson:
Welcome to 2001.
IEEE Design & Test of Computers 18(2): 112- (2001) |
| 2000 |
|---|
| 28 | | Scott Davidson:
Twenty Years Ago Today.
IEEE Design & Test of Computers 17(1): 111-112 (2000) |
| 27 | EE | Scott Davidson,
Justin E. Harlow III:
Guest Editors' Introduction: Benchmarking for Design and Test.
IEEE Design & Test of Computers 17(3): 12-14 (2000) |
| 26 | | Scott Davidson:
Testing in 2100.
IEEE Design & Test of Computers 17(4): 119-120 (2000) |
| 1999 |
|---|
| 25 | | Scott Davidson:
Changing our Path to High Level ATPG.
ITC 1999: 1114 |
| 24 | | Scott Davidson:
ITC'99 Benchmark Circuits - Preliminary Results.
ITC 1999: 1125 |
| 23 | | Scott Davidson:
How Do I Boot Thee? Let Me Check Page 3.
IEEE Design & Test of Computers 16(2): 96- (1999) |
| 1998 |
|---|
| 22 | EE | Scott Davidson:
ASIC jeopardy-diagnosing without a FAB.
ITC 1998: 1136 |
| 21 | EE | José M. Miranda,
Scott Davidson,
Peter Dziel,
Saman Adham,
Steve Millman:
Test Reuse at System Level.
VTS 1998: 318-319 |
| 20 | | Scott Davidson:
The Newer Colossus.
IEEE Design & Test of Computers 15(2): 96- (1998) |
| 19 | | Scott Davidson:
Minutes Found on a Cave Wall.
IEEE Design & Test of Computers 15(3): 128- (1998) |
| 18 | | Scott Davidson:
The Last Byte.
IEEE Design & Test of Computers 15(4): 96- (1998) |
| 1997 |
|---|
| 17 | EE | Scott Davidson:
George learns test.
IEEE Design & Test of Computers 14(1): 96- (1997) |
| 16 | EE | Scott Davidson:
Why projects are late.
IEEE Design & Test of Computers 14(2): 96- (1997) |
| 1996 |
|---|
| 15 | | Scott Davidson:
Base 1 logic: A method for environmentally friendly PC design.
IEEE Design & Test of Computers 13(1): 88- (1996) |
| 14 | EE | Scott Davidson:
A test puzzle for a TGIF morning.
IEEE Design & Test of Computers 13(2): 96- (1996) |
| 13 | | Scott Davidson:
How to achieve 95% fault coverage without really trying.
IEEE Design & Test of Computers 13(3): 120- (1996) |
| 1994 |
|---|
| 12 | | Scott Davidson:
Is IDDQ Yield Loss Inevitable?
ITC 1994: 572-579 |
| 11 | | S. Hwang,
Rochit Rajsuman,
Scott Davidson:
IDDQ Detection of CMOS Bridging Faults by Stuck-At Fault Tests.
VLSI Design 1994: 183-186 |
| 1992 |
|---|
| 10 | EE | Scott Davidson:
Algorithm for selecting the parent structural unit of a ring-chain assembly.
Journal of Chemical Information and Computer Sciences 32(3): 215-221 (1992) |
| 1991 |
|---|
| 9 | EE | Scott Davidson:
Compact numeric alkane codes derived from IUPAC nomenclature.
Journal of Chemical Information and Computer Sciences 31(3): 417-422 (1991) |
| 1989 |
|---|
| 8 | | Scott Davidson:
Guest Editor's Introduction: Software Tools for Hardware Tests.
IEEE Computer 22(4): 12-14 (1989) |
| 7 | EE | Scott Davidson:
An improved IUPAC-based method for identifying alkanes.
Journal of Chemical Information and Computer Sciences 29(3): 151-155 (1989) |
| 1986 |
|---|
| 6 | | Scott Davidson,
James L. Lewandowski:
ESIM/AFS : A Concurrent Architectural Level Fault Simulator.
ITC 1986: 375-385 |
| 1985 |
|---|
| 5 | EE | Scott Davidson:
High level design automation tools (session overview).
ACM Conference on Computer Science 1985: 73 |
| 1984 |
|---|
| 4 | | Scott Davidson:
Fault Simulation at the Architectural Level.
ITC 1984: 669-679 |
| 1981 |
|---|
| 3 | | Scott Davidson,
David Landskov,
Bruce Shriver,
Patrick W. Mallett:
Some Experiments in Local Microcode Compaction for Horizontal Machines.
IEEE Trans. Computers 30(7): 460-477 (1981) |
| 1980 |
|---|
| 2 | | Bruce D. Shriver,
Scott Davidson:
Firmware Engineering - Firmware Engineering.
Firmware Engineering 1980: 25-71 |
| 1 | | David Landskov,
Scott Davidson,
Bruce Shriver,
Patrick W. Mallett:
Local Microcode Compaction Techniques.
ACM Comput. Surv. 12(3): 261-294 (1980) |
