| |
| * | 2008 | |
|---|---|---|
| 1 | EE | Jin Guo, Antonis Papanikolaou, Michele Stucchi, Kristof Croes, Zsolt Tokei, Francky Catthoor: A tool flow for predicting system level timing failures due to interconnect reliability degradation. ACM Great Lakes Symposium on VLSI 2008: 291-296 |
| 1 | Francky Catthoor | [1] |
| 2 | Jin Guo | [1] |
| 3 | Antonis Papanikolaou | [1] |
| 4 | Michele Stucchi | [1] |
| 5 | Zsolt Tokei | [1] |