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Bernard Courtois Vis

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*2009
54EEBernard Courtois, Kholdoun Torki, S. Dumont, S. Eyraud, J.-F. Paillotin, G. di Pendina: Infrastructures for Education, Research and Industry in Microelectronics A Look Worldwide and a Look at India. VLSI Design 2009: 561-566
2007
53EEP. Szabo, B. Nemeth, Márta Rencz, Bernard Courtois: Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology CoRR abs/0711.3301: (2007)
2006
52EEBernard Courtois: Session Abstract. VTS 2006: 150-151
2005
51EEBernard Courtois: Special issue on European Micro and Nano Systems (EMN04) held in Paris, 20-21 October, 2004. Microelectronics Journal 36(7): 613 (2005)
2004
50EEBernard Courtois: Infrastructures for Education, Research and Industry in Microelectronics - A review. DELTA 2004: 149-156
49EESalvador Mir, Libor Rufer, Bernard Courtois: On-chip testing of embedded transducers. VLSI Design 2004: 463-
2003
48EEBernard Courtois: Infrastrukturen für Forschung und Lehre: von nationalen Initiativen zu weltweiten Entwicklungen. it - Information Technology 45(6): (2003)
2001
47EEKholdoun Torki, Bernard Courtois: CMP: The Access to Advanced Low Costy Manufacturing. MSE 2001: 6-
46EEBenoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217
45EEBenoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electronic Testing 17(6): 459-470 (2001)
2000
44EESalvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz: Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33
43EEMarcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois: Design of self-checking fully differential circuits and boards. IEEE Trans. VLSI Syst. 8(2): 113-128 (2000)
42EESalvador Mir, Benoît Charlot, Bernard Courtois: Extending Fault-Based Testing to Microelectromechanical Systems. J. Electronic Testing 16(3): 279-288 (2000)
41EEMárta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois: IDDQ Testing of Submicron CMOS - by Cooling? J. Electronic Testing 16(5): 453-461 (2000)
1999
40 Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328
39EEKholdoun Torki, Bernard Courtois: Advanced Low Cost Manufacturing From CMP Service. MSE 1999: 4-5
38 Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-
37 Bernard Courtois, R. D. (Shawn) Blanton: Guest Editors' Introduction. IEEE Design & Test of Computers 16(4): 16-17 (1999)
1998
36EEMarcelo Lubaszewski, Érika F. Cota, Bernard Courtois: Microsystems Testing: an Approach and Open Problems. DATE 1998: 524-
35EES. J. Abou-Samra, P. A. Aisa, Alain Guyot, Bernard Courtois: 3D CMOS SOL for high performance computing. ISLPED 1998: 54-58
34EEA. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois: Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550
33EEVladimir Székely, Márta Rencz, Bernard Courtois: Tracing the Thermal Behavior of ICs. IEEE Design & Test of Computers 15(2): 14-21 (1998)
32 Marcelo Lubaszewski, Bernard Courtois: A Reliable Fail-Safe System. IEEE Trans. Computers 47(2): 236-241 (1998)
31EEVladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring of Self-Checking Systems. J. Electronic Testing 12(1-2): 81-92 (1998)
1997
30EEJean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: CAD and Foundries for Microsystems. DAC 1997: 674-679
29EEKlaus Hofmann, Manfred Glesner, Nicu Sebe, A. Manolescu, Santiago Marco, Josep Samitier, Jean-Michel Karam, Bernard Courtois: Generation of the HDL-A-model of a micromembrane from its finite-element-description. ED&TC 1997: 108-112
28EEVladimir Székely, Márta Rencz, Bernard Courtois: Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS 1997: 440-445
27EEJean-Michel Karam, Bernard Courtois, Hicham Boutamine: CAD Tools for Bridging Microsystems and Foundries. IEEE Design & Test of Computers 14(2): 34-39 (1997)
1996
26EEVladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288
25 Bozena Kaminska, Bernard Courtois: Guest Editors' Introduction: Mixed Analog and Digital Systems. IEEE Design & Test of Computers 13(2): 8-9 (1996)
24 Bernard Courtois: Second Therminic Workshop. IEEE Design & Test of Computers 13(4): 5- (1996)
23EESalvador Mir, Marcelo Lubaszewski, Bernard Courtois: Unified built-in self-test for fully differential analog circuits. J. Electronic Testing 9(1-2): 135-151 (1996)
22EESalvador Mir, Marcelo Lubaszewski, Bernard Courtois: Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electronic Testing 9(1-2): 43-57 (1996)
21EEBozena Kaminska, Bernard Courtois: Guest editorial. J. Electronic Testing 9(1-2): 7-8 (1996)
1995
20EEVishwani D. Agrawal, Bernard Courtois, Fumiyasu Hirose, Sandip Kundu, Chung-Len Lee, Yinghua Min, P. Pal Chaudhuri: Panel: New Research Problems in the Emerging Test Technology. Asian Test Symposium 1995: 189-
19EEKhaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski: Frequency-based BIST for analog circuit testin. VTS 1995: 54-59
18 Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois: Conference Reports. IEEE Design & Test of Computers 12(4): 95-97 (1995)
17 Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois: Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. IEEE Trans. Computers 44(2): 223-233 (1995)
16EEVladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Analog checkers with absolute and relative tolerances. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995)
1994
15EESalvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois: Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490
1993
14 F. L. Vargas, Michael Nicolaidis, Bernard Courtois: Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments. ICCD 1993: 596-600
1992
13 Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski: Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. ITC 1992: 120-129
12 Marcelo Lubaszewski, Bernard Courtois: On the Design of Self-Checking Boundary Scannable Boards. ITC 1992: 372-381
1991
11 Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois: Built-In Self-Test for Multi-Port RAMs. ICCAD 1991: 248-251
10 M. Marzouki, J. Laurent, Bernard Courtois: Coupling Electron-Beam Probing with Knowledge-Based Fault Localization. ITC 1991: 238-247
1990
9EEP. Bondono, Ahmed Amine Jerraya, A. Hornik, Bernard Courtois, D. Bonifas: NAUTILE: a safe environment for silicon compilation. EURO-DAC 1990: 605-609
1989
8 René David, Antoine Fuentes, Bernard Courtois: Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989)
1988
7 Jean Paul Caisso, Bernard Courtois: Fault Simulation and Test Pattern Generation at the Multiple-Valued Switch Level. ITC 1988: 94-101
6 Ingrid Jansch, Bernard Courtois: Definition and Design of Strongly Language Disjoint Checkers. IEEE Trans. Computers 37(6): 745-748 (1988)
5 Michael Nicolaidis, Bernard Courtois: Strongly Code Disjoint Checkers. IEEE Trans. Computers 37(6): 751-756 (1988)
1986
4EEAhmed Amine Jerraya, P. Varinot, R. Jamier, Bernard Courtois: Principles of the SYCO compiler. DAC 1986: 715-721
3 J. Laurent, L. Bergher, Bernard Courtois, Jacques P. Collin: Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing. ITC 1986: 465-473
1984
2 H. Sahami, Bernard Courtois: Functional testing vs. structural testing of RAMs. Fehlertolerierende Rechensysteme 1984: 391-403
1981
1 Bernard Courtois: Analytical Testing of Data Processing Sections of Integrated CPUs. ITC 1981: 21-30

Coauthor Index

1S. J. Abou-Samra [35]
2Vishwani D. Agrawal [20]
3P. A. Aisa [35]
4Vladimir Castro Alves [11]
5L. Bergher [3]
6R. D. (Shawn) Blanton (Ronald D. Blanton) [37]
7P. Bondono [9]
8D. Bonifas [9]
9Hicham Boutamine [27] [30]
10Jean Paul Caisso [7]
11A. Castillejo [34]
12Sreejit Chakravarty [18]
13Benoît Charlot [40] [42] [44] [45] [46]
14P. Pal Chaudhuri [20]
15Jacques P. Collin [3]
16Philippe Coste [44]
17Érika F. Cota [36] [40]
18René David [8]
19P. Drake [30]
20S. Dumont [54]
21S. Eyraud [54]
22Antoine Fuentes [8]
23Manfred Glesner [29] [30] [38]
24Alain Guyot [35]
25Sybille Hellebrand [13] [17]
26Fumiyasu Hirose [20]
27Klaus Hofmann [29] [30] [38]
28A. Hornik [9]
29R. Jamier [4]
30Ingrid Jansch [6]
31Ahmed Amine Jerraya [4] [9] [44]
32Bozena Kaminska [18] [19] [21] [25]
33Jean-Michel Karam [26] [27] [29] [30] [31] [34] [38]
34Vladimir Kolarik [15] [16] [43]
35Sandip Kundu [20]
36J. Laurent [3] [10]
37Chung-Len Lee [20]
38P. Lestrat [11]
39Marcelo Lubaszewski [12] [15] [16] [19] [22] [23] [26] [31] [32] [36] [38] [40] [43]
40A. Manolescu [29]
41Santiago Marco [29]
42M. Marzouki [10]
43Yinghua Min [20]
44Salvador Mir [15] [16] [22] [23] [34] [38] [40] [42] [43] [44] [45] [46] [49]
45B. Nemeth [53]
46Michael Nicolaidis [5] [11] [14]
47Gabriela Nicolescu [44]
48C. Nielsen [15] [43]
49J.-F. Paillotin [54]
50Fabien Parrain [44] [45] [46]
51G. di Pendina [54]
52Gil Philips [18]
53András Poppe [30]
54Janusz Rajski [13] [17]
55Márta Rencz [26] [28] [30] [31] [33] [38] [41] [44] [53]
56Libor Rufer [49]
57Khaled Saab [19]
58H. Sahami [2]
59Josep Samitier [29]
60Nicu Sebe [29]
61Ramalingam Sridhar [18]
62P. Szabo [53]
63Vladimir Székely [26] [28] [30] [31] [33] [38] [41]
64Steffen Tarnick [13] [17]
65Kholdoun Torki [39] [41] [47] [54]
66S. Török [41]
67Shambhu J. Upadhyaya [18]
68F. L. Vargas [14]
69P. Varinot [4]
70Srikanth Venkataraman [17]
71D. Veychard [34]
72Nacer-Eddine Zergainoh [44]
73Yervant Zorian [18]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)