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| * | 2003 | |
|---|---|---|
| 2 | EE | Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee: Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC 2003: 1174-1181 |
| 1997 | ||
| 1 | Bob Cometta, Jan Witte: Low Current and Low Voltages-The High-End OP AMP Testing Challenge. ITC 1997: 796-801 | |
| 1 | Abhijit Chatterjee | [2] |
| 2 | Sasikumar Cherubal | [2] |
| 3 | Thomas Kuehl | [2] |
| 4 | David M. Majernik | [2] |
| 5 | Randy Newby | [2] |
| 6 | Ramakrishna Voorakaranam | [2] |
| 7 | Jan Witte | [1] |