Bruce F. Cockburn Vis

*	2009
36	EE	Amirhossein Alimohammad, Saeed Fouladi Fard, Bruce F. Cockburn: FPGA-based accelerator for the verification of leading-edge wireless systems. DAC 2009: 844-847
35	EE	Amirhossein Alimohammad, Saeed Fouladi Fard, Bruce F. Cockburn: A flexible layered architecture for accurate digital baseband algorithm development and verification. DATE 2009: 45-50
	2008
34	EE	Amirhossein Alimohammad, Saeed Fouladi Fard, Bruce F. Cockburn, Christian Schlegel: A Novel Technique for Efficient Hardware Simulation of Spatiotemporally Correlated MIMO Fading Channels. ICC 2008: 718-724
33	EE	Amirhossein Alimohammad, Saeed Fouladi Fard, Bruce F. Cockburn, Christian Schlegel: On the efficiency and accuracy of hybrid pseudo-random number generators for FPGA-based simulations. IPDPS 2008: 1-8
32	EE	Amirhossein Alimohammad, Saeed Fouladi Fard, Bruce F. Cockburn, Christian Schlegel: A single-FPGA multipath MIMO fading channel simulator. ISCAS 2008: 308-311
31	EE	Tyler L. Brandon, John C. Koob, Leendert van den Berg, Zhengang Chen, Amirhossein Alimohammad, Ramkrishna Swamy, Jason Klaus, Stephen Bates, Vincent C. Gaudet, Bruce F. Cockburn, Duncan G. Elliott: A 600-Mb/s encoder and decoder for low-density parity-check convolutional codes. ISCAS 2008: 3090-3093
30	EE	Amirhossein Alimohammad, Saeed Fouladi Fard, Bruce F. Cockburn, Christian Schlegel: An Accurate and Compact Rayleigh and Rician Fading Channel Simulator. VTC Spring 2008: 409-413
29	EE	Amirhossein Alimohammad, Saeed Fouladi Fard, Bruce F. Cockburn, Christian Schlegel: A Compact and Accurate Gaussian Variate Generator. IEEE Trans. VLSI Syst. 16(5): 517-527 (2008)
28	EE	Tyler L. Brandon, Robert Hang, Gary Block, Vincent C. Gaudet, Bruce F. Cockburn, Sheryl Howard, Christian Giasson, Keith Boyle, Paul Goud, Siavash Sheikh Zeinoddin, Anthony Rapley, Stephen Bates, Duncan G. Elliott, Christian Schlegel: A scalable LDPC decoder ASIC architecture with bit-serial message exchange. Integration 41(3): 385-398 (2008)
	2007
27	EE	Amirhossein Alimohammad, Saeed Fouladi Fard, Bruce F. Cockburn, Christian Schlegel: A Compact Fading Channel Simulator Using Timing-Driven Resource Sharing. ASAP 2007: 154-159
26	EE	Amirhossein Alimohammad, Saeed Fouladi Fard, Bruce F. Cockburn, Christian Schlegel: A Flexible Filter Processor for Fading Channel Simulation. FCCM 2007: 339-342
25	EE	Amirhossein Alimohammad, Saeed Fouladi Fard, Bruce F. Cockburn, Christian Schlegel: An Improved SOS-Based Fading Channel Emulator. VTC Fall 2007: 931-935
	2006
24	EE	Bruce F. Cockburn, Keith Boyle: Design and Characterization of a Digital Delay Locked Loop Synthesized from Black Box Standard Cells. CCECE 2006: 1214-1217
23	EE	Saeed Sharifi Tehrani, Bruce F. Cockburn, Stephen Bates: On the Effects of Colored Noise on the Performance of LDPC Codes. SiPS 2006: 226-231
22	EE	Amirhossein Alimohammad, Bruce F. Cockburn: A Reconfigurable SOS-based Rayleigh Fading Channel Simulator. SiPS 2006: 39-44
	2005
21	EE	John C. Koob, Sue Ann Ung, Ashwin S. Rao, Daniel A. Leder, Craig S. Joly, Kristopher C. Breen, Tyler L. Brandon, Michael Hume, Bruce F. Cockburn, Duncan G. Elliott: Test and Characterization of a Variable-Capacity Multilevel DRAM. VTS 2005: 189-197
20	EE	John C. Koob, Daniel A. Leder, Raymond J. Sung, Tyler L. Brandon, Duncan G. Elliott, Bruce F. Cockburn, L. McIlrath: Design of a 3-D fully depleted SOI computational RAM. IEEE Trans. VLSI Syst. 13(3): 358-369 (2005)
	2004
19	EE	Bruce F. Cockburn: Tutorial on Magnetic Tunnel Junction Magnetoresistive Random-Access Memory. MTDT 2004: 46-51
	2003
18	EE	Xiaoling Sun, Bruce F. Cockburn, Duncan G. Elliott: An Efficient Functional Test for the Massively-Parallel C ?RAM Logic-Enhanced Memory Architecture. DFT 2003: 475-
17	EE	Bruce F. Cockburn: The Emergence of High-Density Semiconductor-Compatible Spintronic Memory. ICMENS 2003: 321-326
16	EE	Bruce F. Cockburn, Jesús Hernández Tapia, Duncan G. Elliott: A Multilevel DRAM with Hierarchical Bitlines and Serial Sensing. MTDT 2003: 14-19
15	EE	Daniel Salamon, Bruce F. Cockburn: An Electrical Simulation Model for the Chalcogenide Phase-Change Memory Cell. MTDT 2003: 86-
	2002
14	EE	Michael Redeker, Bruce F. Cockburn, Duncan G. Elliott, Yunan Xiang, Sue Ann Ung: Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM. MTDT 2002: 117-122
13	EE	Michael Redeker, Bruce F. Cockburn, Duncan G. Elliott: An Investigation into Crosstalk Noise in DRAM Structures. MTDT 2002: 123-
12	EE	Bruce F. Cockburn: Panel on Advanced Embedded Memory Technologies. MTDT 2002: 177-178
	2001
11	EE	Raymond J. Sung, John C. Koob, Tyler L. Brandon, Duncan G. Elliott, Bruce F. Cockburn: Design of an Embedded Fully-Depleted SOI SRAM. MTDT 2001: 13-
	1999
10	EE	C. Wickman, Duncan G. Elliott, Bruce F. Cockburn: Cost Models for Large File Memory DRAMs with ECC and Bad Block Marking. DFT 1999: 319-
9	EE	Gershom Birk, Duncan G. Elliott, Bruce F. Cockburn: A Comparative Simulation Study of Four Multilevel DRAMs. MTDT 1999: 102-109
8		Bruce F. Cockburn, Fabrizio Lombardi, Fred J. Meyer: Guest Editors' Introduction: DRAM Architecture and Testing. IEEE Design & Test of Computers 16(1): 19-21 (1999)
7	EE	Michael Redeker, Bruce F. Cockburn, Duncan G. Elliott: Fault Models and Tests for a 2-Bit-per-Cell MLDRAM. IEEE Design & Test of Computers 16(1): 22-31 (1999)
	1998
6	EE	Bruce F. Cockburn, Albert L.-C. Kwong: Transition Maximization Techniques for Enhancing the Two-Pattern Fault Coverage of Pseudorandom Test Pattern Generators. VTS 1998: 430-439
	1995
5		Bruce F. Cockburn, Y.-F. Nicole Sat: Synthesized Transparent BIST for Detecting Scrambled Pattern-Sensitive Faults in RAMs. ITC 1995: 23-32
	1994
4	EE	Bruce F. Cockburn: Deterministic tests for detecting singleV-coupling faults in RAMs. J. Electronic Testing 5(1): 91-113 (1994)
3	EE	Bruce F. Cockburn: Tutorial on semiconductor memory testing. J. Electronic Testing 5(4): 321-336 (1994)
	1992
2	EE	Bruce F. Cockburn, Janusz A. Brzozowski: Near-optimal tests for classes of write-triggered coupling faults in RAMs. J. Electronic Testing 3(3): 251-264 (1992)
	1990
1	EE	Janusz A. Brzozowski, Bruce F. Cockburn: Detection of coupling faults in RAMs. J. Electronic Testing 1(2): 151-162 (1990)

Coauthor Index

1	Amirhossein Alimohammad	[22] [25] [26] [27] [29] [30] [31] [32] [33] [34] [35] [36]
2	Stephen Bates	[23] [28] [31]
3	Leendert van den Berg	[31]
4	Gershom Birk	[9]
5	Gary Block	[28]
6	Keith Boyle	[24] [28]
7	Tyler L. Brandon	[11] [20] [21] [28] [31]
8	Kristopher C. Breen	[21]
9	Janusz A. Brzozowski	[1] [2]
10	Zhengang Chen	[31]
11	Duncan G. Elliott	[7] [9] [10] [11] [13] [14] [16] [18] [20] [21] [28] [31]
12	Saeed Fouladi Fard	[25] [26] [27] [29] [30] [32] [33] [34] [35] [36]
13	Vincent C. Gaudet	[28] [31]
14	Christian Giasson	[28]
15	Paul Goud	[28]
16	Robert Hang	[28]
17	Sheryl Howard	[28]
18	Michael Hume	[21]
19	Craig S. Joly	[21]
20	Jason Klaus	[31]
21	John C. Koob	[11] [20] [21] [31]
22	Albert L.-C. Kwong	[6]
23	Daniel A. Leder	[20] [21]
24	Fabrizio Lombardi	[8]
25	L. McIlrath	[20]
26	Fred J. Meyer	[8]
27	Ashwin S. Rao	[21]
28	Anthony Rapley	[28]
29	Michael Redeker	[7] [13] [14]
30	Daniel Salamon	[15]
31	Y.-F. Nicole Sat	[5]
32	Christian Schlegel	[25] [26] [27] [28] [29] [30] [32] [33] [34]
33	Xiaoling Sun	[18]
34	Raymond J. Sung	[11] [20]
35	Ramkrishna Swamy	[31]
36	Jesús Hernández Tapia	[16]
37	Saeed Sharifi Tehrani	[23]
38	Sue Ann Ung	[14] [21]
39	C. Wickman	[10]
40	Yunan Xiang	[14]
41	Siavash Sheikh Zeinoddin	[28]

Colors in the list of coauthors