| |
| * | 2007 | |
|---|---|---|
| 2 | EE | M. Cimino, Hervé Lapuyade, M. De Matos, Thierry Taris, Yann Deval, Jean-Baptiste Begueret: A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications. J. Electronic Testing 23(6): 593-603 (2007) |
| 2006 | ||
| 1 | EE | M. Cimino, Hervé Lapuyade, M. De Matos, Thierry Taris, Yann Deval, Jean-Baptiste Begueret: A Robust 130nm-CMOS Built-In Current Sensor Dedicated to RF Applications. European Test Symposium 2006: 151-158 |
| 1 | Jean-Baptiste Begueret | [1] [2] |
| 2 | Yann Deval | [1] [2] |
| 3 | Hervé Lapuyade | [1] [2] |
| 4 | M. De Matos | [1] [2] |
| 5 | Thierry Taris | [1] [2] |