Mike Chapman Vis

*	2003
2	EE	Tim Menzies, Justin S. Di Stefano, Mike Chapman: Learning Early Lifecycle IV&V Quality Indicators. IEEE METRICS 2003: 88-97
1	EE	Valerie Wyatt, Justin S. Di Stefano, Mike Chapman, Edward Aycoth: A Metrics Based Approach for Identifying Requirements Risks. SEW 2003: 23

Coauthor Index

1	Edward Aycoth	[1]
2	Tim Menzies	[2]
3	Justin S. Di Stefano	[1] [2]
4	Valerie Wyatt	[1]