C. Bruynseraede Vis

*	2006
1	EE	Antonis Papanikolaou, Miguel Miranda, Hua Wang, Francky Catthoor, M. Satyakiran, Pol Marchal, Ben Kaczer, C. Bruynseraede, Zsolt Tokei: Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. VLSI-SoC 2006: 342-347

Coauthor Index

1	Francky Catthoor	[1]
2	Ben Kaczer	[1]
3	Pol Marchal	[1]
4	Miguel Miranda	[1]
5	Antonis Papanikolaou	[1]
6	M. Satyakiran	[1]
7	Zsolt Tokei	[1]
8	Hua Wang	[1]