| |
| * | 2003 | |
|---|---|---|
| 5 | EE | Saied Bozorgui-Nesbat: A system for fast, full-text entry for small electronic devices. ICMI 2003: 4-11 |
| 1997 | ||
| 4 | EE | Sridhar Narayanan, R. Srinivasan, R. P. Kunda, Marc E. Levitt, Saied Bozorgui-Nesbat: A fault diagnosis methodology for the UltraSPARCTM-I microprocessor. ED&TC 1997: 494-500 |
| 1986 | ||
| 3 | Saied Bozorgui-Nesbat, Edward J. McCluskey: Lower Overhead Design for Testability of Programmable Logic Arrays. IEEE Trans. Computers 35(4): 379-383 (1986) | |
| 1984 | ||
| 2 | Saied Bozorgui-Nesbat, Edward J. McCluskey: Lower Overhead Design for Testability of Programmable Logic Arrays. ITC 1984: 856-865 | |
| 1981 | ||
| 1 | Edward J. McCluskey, Saied Bozorgui-Nesbat: Design for Autonomous Test. IEEE Trans. Computers 30(11): 866-875 (1981) | |
| 1 | R. P. Kunda | [4] |
| 2 | Marc E. Levitt | [4] |
| 3 | Edward J. McCluskey | [1] [2] [3] |
| 4 | Sridhar Narayanan | [4] |
| 5 | R. Srinivasan | [4] |