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William J. Bowhill Vis

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*1998
2EEDilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill: A highly testable and diagnosable fabrication process test chip. ITC 1998: 853-861
1995
1 William J. Bowhill, Shane L. Bell, Bradley J. Benschneider, Andrew J. Black, Sharon M. Britton, Ruben W. Castelino, Dale R. Donchin, John H. Edmondson, Harry R. Fair III, Paul E. Gronowski, Anil K. Jain, Patricia L. Kroesen, Marc E. Lamere, Bruce J. Loughlin, Shekhar Mehta, Robert O. Mueller, Ronald P. Preston, Sribalan Santhanam, Timothy A. Shedd, Michael J. Smith, Stephen C. Thierauf: Circuit Implementation of a 300-MHz 64-bit Second-generation CMOS Alpha CPU Digital Technical Journal 7(1): 0- (1995)

Coauthor Index

1David R. Akeson [2]
2Shane L. Bell [1]
3Bradley J. Benschneider [1]
4Dilip K. Bhavsar [2]
5Andrew J. Black [1]
6Sharon M. Britton [1]
7Ruben W. Castelino [1]
8Dale R. Donchin [1]
9Ugonna Echeruo [2]
10John H. Edmondson [1]
11Harry R. Fair III [1]
12Paul E. Gronowski [1]
13Anil K. Jain [1]
14Patricia L. Kroesen [1]
15Marc E. Lamere [1]
16Bruce J. Loughlin [1]
17Shekhar Mehta [1]
18Robert O. Mueller [1]
19Ronald P. Preston [1]
20Sribalan Santhanam [1]
21Timothy A. Shedd [1]
22Michael J. Smith [1]
23Stephen C. Thierauf [1]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)