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Ameet Bagwe Vis

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*2000
2EEAmeet Bagwe, Rubin A. Parekhji: Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems. Asian Test Symposium 2000: 260-
1 Jais Abraham, Narayan Prasad, Srinivasa Chakravarthy B. S., Ameet Bagwe, Rubin A. Parekhji: A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx. ITC 2000: 417-425

Coauthor Index

1Jais Abraham [1]
2Rubin A. Parekhji [1] [2]
3Narayan Prasad [1]
4Srinivasa Chakravarthy B. S. [1]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)