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Asmik Bagramian Vis

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*1999
1EEW. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel: Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM Journal of Research and Development 43(3): 407-416 (1999)

Coauthor Index

1W. W. (Bill) Abadeer [1]
2David W. Conkle [1]
3Charles W. Griffin [1]
4Eric Langlois [1]
5Brian F. Lloyd [1]
6Raymond P. Mallette [1]
7James E. Massucco [1]
8Jonathan M. McKenna [1]
9Steven W. Mittl [1]
10Philip H. Noel [1]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)