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M. Bafleur Vis

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*2006
7EEC. Lochot, J. P. Lainé, M. Bafleur, A. Cazarré, J. Tasselli: Potentialities of substrate-thinning technique to control minority carrier injection in smart power IC's. Microelectronics Journal 37(8): 804-811 (2006)
6EEF. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006)
2005
5EEN. Guitard, F. Essely, D. Trémouilles, M. Bafleur, N. Nolhier, Philippe Perdu, A. Touboul, V. Pouget, D. Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)
2003
4EED. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères: TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectronics Reliability 43(1): 71-79 (2003)
3EET. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
2EEM. Zecri, P. Besse, P. Givelin, M. Nayrolles, M. Bafleur, N. Nolhier: Determination of the ESD Failure Cause Through its Signature. Microelectronics Reliability 43(9-11): 1551-1556 (2003)
2001
1 Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis: Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1539-1544 (2001)

Coauthor Index

1T. Beauchêne [3]
2Felix Beaudoin [1] [3] [4] [6]
3G. Bertrand [4]
4P. Besse [2]
5A. Cazarré [7]
6F. Darracq [6]
7Romain Desplats [1] [3]
8F. Essely [5] [6]
9Pascal Fouillat [3]
10P. Givelin [2]
11N. Guitard [4] [5] [6]
12J. P. Lainé [7]
13L. Lescouzères [4]
14D. Lewis [1] [3] [5] [6]
15C. Lochot [7]
16M. Nayrolles [2]
17N. Nolhier [2] [5]
18Philippe Perdu [1] [3] [4] [5] [6]
19P. Poirier [1]
20V. Pouget [3] [5] [6]
21M. Remmach [6]
22J. Tasselli [7]
23A. Touboul [5] [6]
24D. Trémouilles [1] [3] [4] [5]
25M. Zecri [2]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)