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C. Baena Vis

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*2002
1EEC. Baena, Jorge Juan-Chico, Manuel J. Bellido, Paulino Ruiz-de-Clavijo, Carlos J. Jiménez, Manuel Valencia: Measurement of the Switching Activity of CMOS Digital Circuits at the Gate Level. PATMOS 2002: 353-362

Coauthor Index

1Manuel Jesús Bellido Díaz (Manuel J. Bellido) [1]
2Carlos J. Jiménez [1]
3Jorge Juan-Chico [1]
4Paulino Ruiz-de-Clavijo [1]
5Manuel Valencia [1]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)