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Seog-soon Baek Vis

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*2005
1EEJi-hyuk Lim, Keon Kuk, Seung-joo Shin, Seog-soon Baek, Young-jae Kim, Jong-woo Shin, Yong-soo Oh: Failure mechanisms in thermal inkjet printhead analyzed by experiments and numerical simulation. Microelectronics Reliability 45(3-4): 473-478 (2005)

Coauthor Index

1Young-jae Kim [1]
2Keon Kuk [1]
3Ji-hyuk Lim [1]
4Yong-soo Oh [1]
5Jong-woo Shin [1]
6Seung-joo Shin [1]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)