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S. Baek Vis

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*2001
1EEY. Chu, S. Baek, H. Yonekawa, A. Chertovskikh, M. Kim, J. S. Kim, K. Park, S. Baang, Y. Chang, J. H. Kim, S. Lee, B. Lim, W. Chung, H. Park, K. Kim: Data Acquisition and Database Management System for Samsung Superconductor Test Facility CoRR cs.DB/0111018: (2001)

Coauthor Index

1S. Baang [1]
2Y. Chang [1]
3A. Chertovskikh [1]
4Y. Chu [1]
5W. Chung [1]
6J. H. Kim [1]
7J. S. Kim [1]
8K. Kim [1]
9M. Kim [1]
10S. Lee [1]
11B. Lim [1]
12H. Park [1]
13K. Park [1]
14H. Yonekawa [1]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)