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Dong-Hyun Baek Vis

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*2005
1EEDong-Hyun Baek, In-Jae Jeong, Chang Hee Han: Application of Data Mining for Improving Yield in Wafer Fabrication System. ICCSA (4) 2005: 222-231

Coauthor Index

1Chang Hee Han [1]
2In-Jae Jeong [1]

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