Sanghyeon Baeg Vis

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7EESanghyeon Baeg: Low Power Configuration Strategy of TCAM Lookup Table. IEICE Transactions 91-B(3): 915-917 (2008)
6EESanghyeon Baeg: Delay Fault Coverage Enhancement by Partial Clocking for Low-Power Designs With Heavily Gated Clocks. IEEE Trans. on CAD of Integrated Circuits and Systems 26(12): 2215-2221 (2007)
5EESanghyeon Baeg, Sung Soo Chung: Analytical test buffer design for differential signaling I/O buffers by error syndrome analysis. IEEE Trans. VLSI Syst. 13(3): 370-383 (2005)
4 Sung Soo Chung, Sanghyeon Baeg: AC-JTAG: empowering JTAG beyond testing DC nets. ITC 2001: 30-37
3EESanghyeon Baeg, William A. Rogers: A cost-effective design for testability: clock line control and test generation using selective clocking. IEEE Trans. on CAD of Integrated Circuits and Systems 18(6): 850-861 (1999)
2 Sanghyeon Baeg, William A. Rogers: A New Test Generation Methodology Using Selective Clocking for the Clock Line Controlled Circuits. ICCD 1994: 354-358
1 Sanghyeon Baeg, William A. Rogers: Hybrid Design for Testability Combining Scan and Clock Line Control and Method for Test Generation. ITC 1994: 340-349

Coauthor Index

1Sung Soo Chung [4] [5]
2William A. Rogers [1] [2] [3]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)