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J. Badoc Vis

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*2005
1EEYannick Rey-Tauriac, J. Badoc, B. Reynard, R. A. Bianchi, D. Lachenal, A. Bravaix: Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology. Microelectronics Reliability 45(9-11): 1349-1354 (2005)

Coauthor Index

1R. A. Bianchi [1]
2A. Bravaix [1]
3D. Lachenal [1]
4Yannick Rey-Tauriac [1]
5B. Reynard [1]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)