dblp.uni-trier.dewww.uni-trier.de

Nabil Badereddine Vis

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeerX - CSB - MetaPress - Google - Bing - Yahoo

*2008
4EENabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault: A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electronic Testing 24(4): 353-364 (2008)
2006
3EENabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Christian Landrault, Arnaud Virazel, Hans-Joachim Wunderlich: Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing. VLSI-SoC 2006: 403-408
2005
2EENabil Badereddine, Patrick Girard, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault: Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives. PATMOS 2005: 540-549
1EENabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Christian Landrault: Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles. VLSI-SoC 2005: 267-281

Coauthor Index

1Krishnendu Chakrabarty [4]
2Patrick Girard [1] [2] [3] [4]
3Christian Landrault [1] [2] [3] [4]
4Serge Pravossoudovitch [1] [2] [3] [4]
5Arnaud Virazel [1] [2] [3] [4]
6Zhanglei Wang [4]
7Hans-Joachim Wunderlich [3]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)