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V. Bader Vis

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*2006
2EET. Braun, K.-F. Becker, M. Koch, V. Bader, Rolf Aschenbrenner, Herbert Reichl: High-temperature reliability of Flip Chip assemblies. Microelectronics Reliability 46(1): 144-154 (2006)
2005
1EET. Braun, K.-F. Becker, M. Koch, V. Bader, Rolf Aschenbrenner, Herbert Reichl: Reliability Potential Of Epoxy Based Encapsulants For Automotive Applications. Microelectronics Reliability 45(9-11): 1672-1675 (2005)

Coauthor Index

1Rolf Aschenbrenner [1] [2]
2K.-F. Becker [1] [2]
3T. Braun [1] [2]
4M. Koch [1] [2]
5Herbert Reichl [1] [2]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)