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G. Badenes Vis

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*2001
2EEM. Da Rold, E. Simoen, Sofie Mertens, Marc Schaekers, G. Badenes, Stefaan Decoutere: Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS. Microelectronics Reliability 41(12): 1933-1938 (2001)
1EEKai F. Dombrowski, B. Dietrich, I. De Wolf, R. Rooyackers, G. Badenes: Investigation of stress in shallow trench isolation using UV micro-Raman spectroscopy. Microelectronics Reliability 41(4): 511-515 (2001)

Coauthor Index

1Stefaan Decoutere [2]
2B. Dietrich [1]
3Kai F. Dombrowski [1]
4Sofie Mertens [2]
5M. Da Rold [2]
6R. Rooyackers [1]
7Marc Schaekers [2]
8E. Simoen [2]
9I. De Wolf [1]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)