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Dinesh Badami Vis

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*2004
1EEBaozhen Li, Timothy D. Sullivan, Tom C. Lee, Dinesh Badami: Reliability challenges for copper interconnects. Microelectronics Reliability 44(3): 365-380 (2004)

Coauthor Index

1Tom C. Lee [1]
2Baozhen Li [1]
3Timothy D. Sullivan [1]

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