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Eddy De Backer Vis

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*2003
3EEJan Ackaert, Klara Bessemans, Eddy De Backer: Charging induced damage by photoconduction through thick inter metal dielectrics. Microelectronics Reliability 43(9-11): 1525-1529 (2003)
2001
2EEPeter Coppens, Guido Vanhorebeek, Eddy De Backer: Correlation between predicted cause of SRAM failures and in-line defect data. Microelectronics Reliability 41(1): 53-57 (2001)
1 Jan Ackaert, Z. Wang, Eddy De Backer, P. Colson, Peter Coppens: Non Contact Surface Potential Measurements for Charging Reduction During Manufacturing of Metal-Insulator-Metal Capacitors. Microelectronics Reliability 41(9-10): 1403-1407 (2001)

Coauthor Index

1Jan Ackaert [1] [3]
2Klara Bessemans [3]
3P. Colson [1]
4Peter Coppens [1] [2]
5Guido Vanhorebeek [2]
6Z. Wang [1]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)