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Frank Böhland Vis

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*1994
2 Arno Kunzmann, Frank Böhland: Gate-Delay Fault Test with Conventional Scan-Design. EDAC-ETC-EUROASIC 1994: 524-528
1EEArno Kunzmann, Frank Böhland: Self-test of sequential circuits with deterministic test pattern sequences. J. Electronic Testing 5(2-3): 307-312 (1994)

Coauthor Index

1Arno Kunzmann [1] [2]

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