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L. Béchou Vis

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*2005
6EES. Huyghe, L. Béchou, N. Zerounian, Y. Deshayes, F. Aniel, A. Denolle, D. Laffitte, J. L. Goudard, Y. Danto: Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. Microelectronics Reliability 45(9-11): 1593-1599 (2005)
2003
5EEY. Deshayes, L. Béchou, J.-Y. Delétage, F. Verdier, Y. Danto, D. Laffitte, J. L. Goudard: Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectronics Reliability 43(7): 1125-1136 (2003)
4EEJ.-Y. Delétage, F. J.-M. Verdier, B. Plano, Y. Deshayes, L. Béchou, Y. Danto: Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectronics Reliability 43(7): 1137-1144 (2003)
3EEL. Mendizabal, Jean-Louis Verneuil, L. Béchou, Christelle Aupetit-Berthelemot, Y. Deshayes, F. Verdier, Jean-Michel Dumas, Y. Danto, D. Laffitte, J. L. Goudard: Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. Microelectronics Reliability 43(9-11): 1743-1749 (2003)
2002
2EEB. Trégon, Y. Ousten, Y. Danto, L. Béchou, B. Parmentier: Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectronics Reliability 42(7): 1113-1120 (2002)
1EEJ. Augereau, Y. Ousten, L. Béchou, Y. Danto: Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). Microelectronics Reliability 42(9-11): 1517-1522 (2002)

Coauthor Index

1F. Aniel [6]
2J. Augereau [1]
3Christelle Aupetit-Berthelemot [3]
4Y. Danto [1] [2] [3] [4] [5] [6]
5J.-Y. Delétage [4] [5]
6A. Denolle [6]
7Y. Deshayes [3] [4] [5] [6]
8Jean-Michel Dumas [3]
9J. L. Goudard [3] [5] [6]
10S. Huyghe [6]
11D. Laffitte [3] [5] [6]
12L. Mendizabal [3]
13Y. Ousten [1] [2]
14B. Parmentier [2]
15B. Plano [4]
16B. Trégon [2]
17F. Verdier [3] [5]
18F. J.-M. Verdier [4]
19Jean-Louis Verneuil [3]
20N. Zerounian [6]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)