| |
| * | 2004 | |
|---|---|---|
| 2 | EE | Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng: Efficient test solutions for core-based designs. IEEE Trans. on CAD of Integrated Circuits and Systems 23(5): 758-775 (2004) |
| 2002 | ||
| 1 | EE | Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng: Integrated Test Scheduling, Test Parallelization and TAMDesign. Asian Test Symposium 2002: 397-404 |
| 1 | Hideo Fujiwara | [1] [2] |
| 2 | Erik Larsson | [1] [2] |
| 3 | Zebo Peng | [1] [2] |