| 2006 |
|---|
| 7 | EE | Rob Aitken:
Reliability Issues for Embedded SRAM at 90nm and Below.
IOLTS 2006: 75 |
| 2004 |
|---|
| 6 | EE | Rob Aitken:
Redundancy & It's Not Just for Defects Anymore.
MTDT 2004: 117-120 |
| 5 | | Rob Aitken,
Stefan Eichenberger,
Gary Maier,
Sandip Kundu,
Hank Walker:
ITC 2003 Roundtable: Design for Manufacturability.
IEEE Design & Test of Computers 21(2): 144-156 (2004) |
| 4 | | Carol Stolicny,
Tapio Koivukangas,
Rubin A. Parekhji,
Ian G. Harris,
Rob Aitken:
ITC 2003 panels: Part 1.
IEEE Design & Test of Computers 21(2): 160-163 (2004) |
| 3 | | Rob Aitken:
Test at Gbps: Megaproblem or micromanagement?
IEEE Design & Test of Computers 21(4): 344- (2004) |
| 2003 |
|---|
| 2 | EE | Rob Aitken,
Neeraj Dogra,
Dhrumil Gandhi,
Scott Becker:
Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator.
DFT 2003: 467-474 |
| 2002 |
|---|
| 1 | EE | Julie Segal,
Rene Segers,
Rob Aitken,
S. Eichenberge,
A. Gattike,
M. Millegen,
R. Seger,
S. Venkataraman:
Test as a Key Enabler for Faster Yield Ramp-Up.
VTS 2002: 177-180 |
