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Kanak Agarwal

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2008
31EEVivek Joshi, Brian Cline, Dennis Sylvester, David Blaauw, Kanak Agarwal: Stress aware layout optimization. ISPD 2008: 168-174
30EEKanak Agarwal, Sani R. Nassif: The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies. IEEE Trans. VLSI Syst. 16(1): 86-97 (2008)
2007
29EEKanak Agarwal, Sani R. Nassif: Characterizing Process Variation in Nanometer CMOS. DAC 2007: 396-399
28EEKanak Agarwal, Frank Liu: Efficient computation of current flow in signal wires for reliability analysis. ICCAD 2007: 741-746
27EEKanak Agarwal, Kevin J. Nowka: Dynamic Power Management by Combination of Dual Static Supply Voltages. ISQED 2007: 85-92
26EEH. Singh, Kanak Agarwal, Dennis Sylvester, Kevin J. Nowka: Enhanced Leakage Reduction Techniques Using Intermediate Strength Power Gating. IEEE Trans. VLSI Syst. 15(11): 1215-1224 (2007)
25EEKanak Agarwal, Rahul M. Rao, Dennis Sylvester, Richard B. Brown: Parametric Yield Analysis and Optimization in Leakage Dominated Technologies. IEEE Trans. VLSI Syst. 15(6): 613-623 (2007)
2006
24EEKanak Agarwal, Sani R. Nassif: Statistical analysis of SRAM cell stability. DAC 2006: 57-62
23EEEmrah Acar, Kanak Agarwal, Sani R. Nassif: Characterization of total chip leakage using inverse (reciprocal) gamma distribution. ISCAS 2006
22EESani R. Nassif, Kanak Agarwal, Emrah Acar: Methods for estimating decoupling capacitance of nonswitching circuit blocks. ISCAS 2006
21EEKanak Agarwal, Kevin J. Nowka, Harmander Deogun, Dennis Sylvester: Power Gating with Multiple Sleep Modes. ISQED 2006: 633-637
20EEKanak Agarwal, Dennis Sylvester, David Blaauw: Modeling and analysis of crosstalk noise in coupled RLC interconnects. IEEE Trans. on CAD of Integrated Circuits and Systems 25(5): 892-901 (2006)
19EEKanak Agarwal, Mridul Agarwal, Dennis Sylvester, David Blaauw: Statistical interconnect metrics for physical-design optimization. IEEE Trans. on CAD of Integrated Circuits and Systems 25(7): 1273-1288 (2006)
2005
18EEKanak Agarwal, Dennis Sylvester, David Blaauw, Anirudh Devgan: Achieving continuous VT performance in a dual VT process. ASP-DAC 2005: 393-398
17EEMridul Agarwal, Kanak Agarwal, Dennis Sylvester, David Blaauw: Statistical modeling of cross-coupling effects in VLSI interconnects. ASP-DAC 2005: 503-506
16EEAshish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David Blaauw, Stephen W. Director: Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. DAC 2005: 535-540
15EERahul M. Rao, Kanak Agarwal, Dennis Sylvester, Himanshu Kaul, Richard B. Brown, Sani R. Nassif: Power-aware global signaling strategies. ISCAS (1) 2005: 604-607
14EERahul M. Rao, Kanak Agarwal, Anirudh Devgan, Kevin J. Nowka, Dennis Sylvester, Richard B. Brown: Parametric Yield Analysis and Constrained-Based Supply Voltage Optimization. ISQED 2005: 284-290
2004
13EEKanak Agarwal, Dennis Sylvester, David Blaauw: A simplified transmission-line based crosstalk noise model for on-chip RLC wiring. ASP-DAC 2004: 858-864
12EEKanak Agarwal, Dennis Sylvester, David Blaauw, Frank Liu, Sani R. Nassif, Sarma B. K. Vrudhula: Variational delay metrics for interconnect timing analysis. DAC 2004: 381-384
11EESaumil Shah, Kanak Agarwal, Dennis Sylvester: A New Threshold Voltage Assignment Scheme for Runtime Leakage Reduction in On-Chip Repeaters. ICCD 2004: 138-143
10EERahul M. Rao, Kanak Agarwal, Dennis Sylvester, Richard B. Brown, Kevin J. Nowka, Sani R. Nassif: Approaches to run-time and standby mode leakage reduction in global buses. ISLPED 2004: 188-193
9EEKanak Agarwal, Dennis Sylvester, David Blaauw: A library compatible driver output model for on-chip RLC transmission lines. IEEE Trans. on CAD of Integrated Circuits and Systems 23(1): 128-136 (2004)
8EEKanak Agarwal, Dennis Sylvester, David Blaauw: A simple metric for slew rate of RC circuits based on two circuit moments. IEEE Trans. on CAD of Integrated Circuits and Systems 23(9): 1346-1354 (2004)
2003
7EEKanak Agarwal, Dennis Sylvester, David Blaauw: An effective capacitance based driver output model for on-chip RLC interconnects. DAC 2003: 376-381
6EEKanak Agarwal, Dennis Sylvester, David Blaauw: Simple metrics for slew rate of RC circuits based on two circuit moments. DAC 2003: 950-953
5EEShidhartha Das, Kanak Agarwal, David Blaauw, Dennis Sylvester: Optimal Inductance for On-chip RLC Interconnections. ICCD 2003: 264-
4EETakashi Sato, Yu Cao, Kanak Agarwal, Dennis Sylvester, Chenming Hu: Bidirectional closed-form transformation between on-chip coupling noise waveforms and interconnect delay-change curves. IEEE Trans. on CAD of Integrated Circuits and Systems 22(5): 560-572 (2003)
2002
3EEKanak Agarwal, Yu Cao, Takashi Sato, Dennis Sylvester, Chenming Hu: Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis. ASP-DAC 2002: 77-86
2EEKanak Agarwal, Dennis Sylvester, David Blaauw: A library compatible driving point model for on-chip RLC interconnects. Timing Issues in the Specification and Synthesis of Digital Systems 2002: 63-69
1EEKanak Agarwal, Yu Cao, Takashi Sato, Dennis Sylvester, Chenming Hu: Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis. VLSI Design 2002: 77-

Coauthor Index

1Emrah Acar [22] [23]
2Mridul Agarwal [17] [19]
3David Blaauw (David T. Blaauw) [2] [5] [6] [7] [8] [9] [12] [13] [16] [17] [18] [19] [20] [31]
4Richard B. Brown [10] [14] [15] [25]
5Yu Cao [1] [3] [4]
6Brian Cline [31]
7Shidhartha Das [5]
8Harmander Deogun [21]
9Anirudh Devgan [14] [18]
10Stephen W. Director [16]
11Chenming Hu [1] [3] [4]
12Vivek Joshi [31]
13Himanshu Kaul [15]
14Frank Liu [12] [28]
15Sani R. Nassif [10] [12] [15] [22] [23] [24] [29] [30]
16Kevin J. Nowka [10] [14] [21] [26] [27]
17Rahul M. Rao [10] [14] [15] [25]
18Takashi Sato [1] [3] [4]
19Saumil Shah [11] [16]
20H. Singh [26]
21Ashish Srivastava [16]
22Dennis Sylvester [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [25] [26] [31]
23Sarma B. K. Vrudhula [12]

Copyright © Thu Jun 5 07:42:39 2008 by Michael Ley (ley@uni-trier.de)