Miron Abramovici

2007
61	EE	John M. Emmert, Charles E. Stroud, Miron Abramovici: Online Fault Tolerance for FPGA Logic Blocks. IEEE Trans. VLSI Syst. 15(2): 216-226 (2007)
2006
60	EE	Miron Abramovici, Paul Bradley, Kumar N. Dwarakanath, Peter Levin, Gérard Memmi, Dave Miller: A reconfigurable design-for-debug infrastructure for SoCs. DAC 2006: 7-12
2005
59	EE	Xiaoming Yu, Miron Abramovici: Sequential circuit ATPG using combinational algorithms. IEEE Trans. on CAD of Integrated Circuits and Systems 24(8): 1294-1310 (2005)
2004
58	EE	Miron Abramovici, Charles E. Stroud, John M. Emmert: Online BIST and BIST-based diagnosis of FPGA logic blocks. IEEE Trans. VLSI Syst. 12(12): 1284-1294 (2004)
2002
57	EE	Miron Abramovici, Xiaoming Yu, Elizabeth M. Rudnick: Low-cost sequential ATPG with clock-control DFT. DAC 2002: 243-248
56	EE	Miron Abramovici, Charles E. Stroud, Marty Emmert: Using embedded FPGAs for SoC yield improvement. DAC 2002: 713-724
55	EE	Miron Abramovici, Charles E. Stroud: BIST-Based Delay-Fault Testing in FPGAs. IOLTW 2002: 131-134
54	EE	Charles E. Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici: BIST-Based Diagnosis of FPGA Interconnect. ITC 2002: 618-627
2001
53	EE	John M. Emmert, Stanley Baumgart, Pankaj Kataria, Andrew M. Taylor, Charles E. Stroud, Miron Abramovici: On-Line Fault Tolerance for FPGA Interconnect with Roving STARs. DFT 2001: 445-454
52	EE	Miron Abramovici, John M. Emmert, Charles E. Stroud: Roving Stars: An Integrated Approach To On-Line Testing, Diagnosis, And Fault Tolerance For Fpgas In Adaptive Computing Systems. Evolvable Hardware 2001: 73-92
51	EE	Miron Abramovici, Charles E. Stroud, Matthew Lashinsky, Jeremy Nall, John M. Emmert: On-Line BIST and Diagnosis of FPGA Interconnect Using Roving STARs. IOLTW 2001: 27-33
50		Jongshin Shin, Xiaoming Yu, Elizabeth M. Rudnick, Miron Abramovici: At-speed logic BIST using a frozen clock testing strategy. ITC 2001: 64-71
49	EE	Miron Abramovici, Charles E. Stroud: BIST-based test and diagnosis of FPGA logic blocks. IEEE Trans. VLSI Syst. 9(1): 159-172 (2001)
2000
48	EE	John M. Emmert, Charles E. Stroud, Brandon Skaggs, Miron Abramovici: Dynamic Fault Tolerance in FPGAs via Partial Reconfiguration. FCCM 2000: 165-174
47	EE	John M. Emmert, Charles E. Stroud, Jason A. Cheatham, Andrew M. Taylor, Pankaj Kataria, Miron Abramovici: Performance Penalty for Fault Tolerance in Roving STARs. FPL 2000: 545-554
46	EE	Miron Abramovici, Charles E. Stroud, Brandon Skaggs, John M. Emmert: Improving On-Line BIST-Based Diagnosis for Roving STARs. IOLTW 2000: 31-39
45		Miron Abramovici, Charles E. Stroud: DIST-based detection and diagnosis of multiple faults in FPGAs. ITC 2000: 785-794
44		Qiang Peng, Miron Abramovici, Jacob Savir: MUST: multiple-stem analysis for identifying sequentially untestable faults. ITC 2000: 839-846
43	EE	David E. Long, Mahesh A. Iyer, Miron Abramovici: FILL and FUNI: algorithms to identify illegal states and sequentially untestable faults. ACM Trans. Design Autom. Electr. Syst. 5(3): 631-657 (2000)
42		Miron Abramovici, José T. de Sousa: A SAT Solver Using Reconfigurable Hardware and Virtual Logic. J. Autom. Reasoning 24(1/2): 5-36 (2000)
41	EE	Elizabeth M. Rudnick, Miron Abramovici: Compact Test Generation Using a Frozen Clock Testing Strategy. J. Inf. Sci. Eng. 16(5): 703-717 (2000)
1999
40	EE	Miron Abramovici, José T. de Sousa, Daniel G. Saab: A Massively-Parallel Easily-Scalable Satisfiability Solver Using Reconfigurable Hardware. DAC 1999: 684-690
39	EE	Yanti Santoso, Matthew C. Merten, Elizabeth M. Rudnick, Miron Abramovici: FreezeFrame: Compact Test Generation Using a Frozen Clock Strategy. DATE 1999: 747-
38	EE	Miron Abramovici, José T. de Sousa: A Virtual Logic Algorithm for Solving Satisfiability Problems Using Reconfigurable Hardware. FCCM 1999: 306-307
37		Miron Abramovici, Charles E. Stroud, Carter Hamilton, Sajitha Wijesuriya, Vinay Verma: Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications. ITC 1999: 973-982
1998
36	EE	Charles E. Stroud, Sajitha Wijesuriya, Carter Hamilton, Miron Abramovici: Built-in self-test of FPGA interconnect. ITC 1998: 404-411
1997
35	EE	Miron Abramovici, Premachandran R. Menon: Fault simulation on reconfigurable hardware. FCCM 1997: 182-191
34		Miron Abramovici, Daniel G. Saab: Satisfiability on reconfigurable hardware. FPL 1997: 448-456
33		Charles E. Stroud, Eric Lee, Miron Abramovici: BIST-Based Diagnostics of FPGA Logic Blocks. ITC 1997: 539-547
1996
32	EE	Mahesh A. Iyer, David E. Long, Miron Abramovici: Identifying Sequential Redundancies Without Search. DAC 1996: 457-462
31	EE	Charles E. Stroud, Ping Chen, Srinivasa Konala, Miron Abramovici: Evaluation of FPGA Resources for Built-In Self-Test of Programmable Logic Blocks. FPGA 1996: 107-113
30		Charles E. Stroud, Eric Lee, Srinivasa Konala, Miron Abramovici: Using ILA Testing for BIST in FPGAs. ITC 1996: 68-75
29	EE	Krishna B. Rajan, David E. Long, Miron Abramovici: Increasing testability by clock transformation (getting rid of those darn states). VTS 1996: 224-230
28	EE	Charles E. Stroud, Srinivasa Konala, Ping Chen, Miron Abramovici: Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!). VTS 1996: 387-392
27	EE	Mahesh A. Iyer, Miron Abramovici: FIRE: a fault-independent combinational redundancy identification algorithm. IEEE Trans. VLSI Syst. 4(2): 295-301 (1996)
1995
26		Prashant S. Parikh, Miron Abramovici: On Combining Design for Testability Techniques. ITC 1995: 423-429
25	EE	David E. Long, Mahesh A. Iyer, Miron Abramovici: Identifying sequentially untestable faults using illegal states. VTS 1995: 4-11
1994
24		Mahesh A. Iyer, Miron Abramovici: Sequentially Untestable Faults Identified Without Search ("Simple Implications Beat Exhaustive Search!"). ITC 1994: 259-266
23		Mahesh A. Iyer, Miron Abramovici: Low-Cost Redundancy Identification for Combinatorial Circuits. VLSI Design 1994: 315-318
1993
22	EE	Prashant S. Parikh, Miron Abramovici: A Cost-Based Approach to Partial Scan. DAC 1993: 255-259
21		Miron Abramovici, Prashant S. Parikh, Ben Mathew, Daniel G. Saab: On Selecting Flip-Flops for Partial Reset. ITC 1993: 1008-1012
20		Miron Abramovici: DOs and DON'Ts in Computing Fault Coverage. ITC 1993: 594
1992
19	EE	Miron Abramovici, Krishna B. Rajan, David T. Miller: Freeze!: A New Approach for Testing Sequential Circuits. DAC 1992: 22-25
18		Miron Abramovici, Prashant S. Parikh: Warning: 100% Fault Coverage May Be Misleading!! ITC 1992: 662-668
17		Miron Abramovici, Mahesh A. Iyer: One-Pass Redundancy Identification and Removal. ITC 1992: 807-815
16	EE	Miron Abramovici, David T. Miller, Rabindra K. Roy: Dynamic redundancy identification in automatic test generation. IEEE Trans. on CAD of Integrated Circuits and Systems 11(3): 404-407 (1992)
1991
15		Miron Abramovici, James J. Kulikowski, Rabindra K. Roy: The Best Flip-Flops to Scan. ITC 1991: 166-173
14	EE	Premachandran R. Menon, Ytzhak H. Levendel, Miron Abramovici: SCRIPT: a critical path tracing algorithm for synchronous sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 10(6): 738-747 (1991)
1988
13		Miron Abramovici, B. Krishnamurthy, A. Mathews, B. Rogers, M. Schulz, S. Seth, John A. Waicukauski: What is the Path to Fast Fault Simulation? ITC 1988: 183-192
1986
12		Miron Abramovici, Premachandran R. Menon, David T. Miller: Checkpoint Faults are not Sufficient Target Faults for Test Generation. IEEE Trans. Computers 35(8): 769-771 (1986)
1985
11		Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller: Test Generation In Lamp2: System Overview. ITC 1985: 45-48
10		Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller: Test Generation In Lamp2: Concepts and Algorithms. ITC 1985: 49-56
9		Miron Abramovici: Low-Cost Fault Simulation: Why, When and How. ITC 1985: 795
8		Miron Abramovici, Premachandran R. Menon: A Practical Approach to Fault Simulation and Test Generation for Bridging Faults. IEEE Trans. Computers 34(7): 658-663 (1985)
1983
7		Miron Abramovici, Premachandran R. Menon: A Practical Approach to Fault Simulation and Test Generation for Bridging Faults. ITC 1983: 138-142
6	EE	Miron Abramovici, Ytzhak H. Levendel, Premachandran R. Menon: A Logic Simulation Machine. IEEE Trans. on CAD of Integrated Circuits and Systems 2(2): 82-94 (1983)
1982
5	EE	Miron Abramovici, Ytzhak H. Levendel, Premachandran R. Menon: A logic simulation machine. ISCA 1982: 148-157
4		Miron Abramovici, Melvin A. Breuer: Fault Diagnosis in Synchronous Sequential Circuits Based on an Effect-Cause Analysis. IEEE Trans. Computers 31(12): 1165-1172 (1982)
3		Miron Abramovici: A Hierarchical, Path-Oriented Approach to Fault Diagnosis in Modular Combinational Circuits. IEEE Trans. Computers 31(7): 672-677 (1982)
1980
2		Miron Abramovici, Melvin A. Breuer: Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis. IEEE Trans. Computers 29(6): 451-460 (1980)
1979
1		Miron Abramovici, Melvin A. Breuer: On Redundancy and Fault Detection in Sequential Circuits. IEEE Trans. Computers 28(11): 864-865 (1979)

Coauthor Index

1	Stanley Baumgart	[53]
2	Paul Bradley	[60]
3	Melvin A. Breuer	[1] [2] [4]
4	Jason A. Cheatham	[47]
5	Ping Chen	[28] [31]
6	Kumar N. Dwarakanath	[60]
7	John M. Emmert	[46] [47] [48] [51] [52] [53] [58] [61]
8	Marty Emmert	[56]
9	Carter Hamilton	[36] [37]
10	Mahesh A. Iyer	[17] [23] [24] [25] [27] [32] [43]
11	Pankaj Kataria	[47] [53]
12	Srinivasa Konala	[28] [30] [31]
13	B. Krishnamurthy	[13]
14	James J. Kulikowski	[10] [11] [15]
15	Matthew Lashinsky	[51] [54]
16	Eric Lee	[30] [33]
17	Ytzhak H. Levendel	[5] [6] [14]
18	Peter Levin	[60]
19	David E. Long	[25] [29] [32] [43]
20	Ben Mathew	[21]
21	A. Mathews	[13]
22	Gérard Memmi	[60]
23	Premachandran R. Menon	[5] [6] [7] [8] [10] [11] [12] [14] [35]
24	Matthew C. Merten	[39]
25	Dave Miller	[60]
26	David T. Miller	[10] [11] [12] [16] [19]
27	Jeremy Nall	[51] [54]
28	Prashant S. Parikh	[18] [21] [22] [26]
29	Qiang Peng	[44]
30	Krishna B. Rajan	[19] [29]
31	B. Rogers	[13]
32	Rabindra K. Roy	[15] [16]
33	Elizabeth M. Rudnick	[39] [41] [50] [57]
34	Daniel G. Saab	[21] [34] [40]
35	Yanti Santoso	[39]
36	Jacob Savir	[44]
37	M. Schulz	[13]
38	S. Seth	[13]
39	Jongshin Shin	[50]
40	Brandon Skaggs	[46] [48]
41	José T. de Sousa	[38] [40] [42]
42	Charles E. Stroud	[28] [30] [31] [33] [36] [37] [45] [46] [47] [48] [49] [51] [52] [53] [54] [55] [56] [58] [61]
43	Andrew M. Taylor	[47] [53]
44	Vinay Verma	[37]
45	John A. Waicukauski	[13]
46	Sajitha Wijesuriya	[36] [37]
47	Xiaoming Yu	[50] [57] [59]

Colors in the list of coauthors