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ITC 1993: Baltimore, MD, USA

Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. IEEE Computer Society 1993, ISBN 0-7803-1430-1 CiteSeerX Google scholar pubzone.org BibTeX bibliographical record in XML
@proceedings{DBLP:conf/itc/1993,
  title     = {Proceedings IEEE International Test Conference 1993, Designing,
               Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA,
               October 17-21, 1993},
  publisher = {IEEE Computer Society},
  year      = {1993},
  isbn      = {0-7803-1430-1},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Plenary

System Testing

I-DDQ And Logic Testing of CMOS Bridging

SPC-Based Intelligent Test

Advancement In Test Generation

IEEE STD 1149.1 In Action

Software Testability

Cost-Effective Application Of Ate

Delay Testing - Self Test

Panel: IEEE STD 1149.1: Barriers - Real and Irrational!

Panel: Known Good Die: A Key To Cost Effective MCMs

Panel: DFT - Profit Or Loss?

Panel: Software Testing Got You Down?

How Can CMOS IC Quality Be Improved?

Testability Structures For Mixed-Signal Board Testing

On-Product Bist

Multichip Module Testing

DFT: Putting Principles Into Practice

Making Test Generation Faster

Test Engineering Strategies I

Test Data Management

DFT: Winning It With Partial Scan

IEEE STD 1149.1 Design Issues

Timing Systems - Analysis And Time Measurement

Realistic Quality Practices

Panel: Mixed-Signal Test Bus: Has It Arrived?

Panel: Test Synthesis: Fact Or Fiction?

Panel: Fault Coverage Numbers: What Do They Really Mean?

Constrained Test Generation

Novel And Practical Power Supply Current Test Techniques

Board Test: Analog, Bare Board, Digital

Mixed Signal Device Test Techniques

Compact Delay Testing

Synthesis And Testability

Microprocessor And VLSI Testing Case Studies

Design-For-Test Considerations For Mixed-Signal Devices

Memory Test

Software Testing Methods

Detection Of Physical Defects

Test Engineering Strategies II

Selected Topics In Test

Delay Testing

DFT: New Tricks Of The Old Trade

BIST Pattern Generation

1992 Best Paper

Copyright © Mon Nov 2 20:54:07 2009 by Michael Ley (ley@uni-trier.de)