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ITC 1989: Washington, D.C., USA

Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. IEEE Computer Society 1989 CiteSeerX Google scholar pubzone.org BibTeX bibliographical record in XML
@proceedings{DBLP:conf/itc/1989,
  title     = {Proceedings International Test Conference 1989, Washington, D.C.,
               USA, August 1989},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1989},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Session 2: Sequential ATPG

Session 3: Boundary Scan Algorithms and Implementation

Session 4: Systems Test I

Session 5: Mixed Signal Testing I

Session 6: Delay Test Generation

Session 7: Boundary Scan in Board and Prototype Testing Today

Session 8: Coupling, Distribution and Probes

Session 9: Mixed Signal Testing II

Session 10: Panel Session, Design and Test in the University

Session 11: Panel Session, SPC/TQM What It Is ... What It Is Not

Session 13: Pattern Generation for Built-In-Self-Test

Session 14: Systems Test II

Session 15: Practical Quality Isues- Today

Session 16: Design for Test of VLSI Memories

Session 17: Topics in Signature Analysis

Session 18: Testability Analysis

Session 19: Leading Edge Quality Issues

Session 20: Concepts in Memory Testing

Session 21: Hierarichical Test Generation

Session 22: Synthesis for Testability

Session 23: Process Improvement Aided by New Analytic Approaches

Session 24: Logic ATE Architecture

Session 25: Panel Session, Random Vectors in External Testing: Free Lunch or Hidden Costs?

Session 26: Test Software

Session 27: Managing the Cost or VLSI Testing

Session 28: Advanced Test Solutions In Today`s VLSI Processors

Session 29: Physical Defects ub VLSI Chips

Session 30: Design For Testability

Session 31: Board Test I- Test Development and Applications

Session 32: Advances in Fault Simulation

Session 33: Practical Considerations in BIST Implementation

Session 34: Board Test II- Architecture and Accuracy

Session 35: New Topics in ATPG

Session 36: CAE and Workstations

Session 37: Drivers, Detectors and Sensitivities.

Session 38: The Economics of Design-for-Testability

Session 39: ASIC Products-The Test Challenge

Session 40: E-Beam Update

Poster Session

Copyright © Mon Nov 2 20:54:07 2009 by Michael Ley (ley@uni-trier.de)