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ITC 1981: Philadelphia, PA, USA

Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. IEEE Computer Society 1981 CiteSeerX Google scholar pubzone.org BibTeX bibliographical record in XML
@proceedings{DBLP:conf/itc/1981,
  title     = {Proceedings International Test Conference 1981, Philadelphia,
               PA, USA, October 1981},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1981},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Session 1: Keynote Address and Invited Panel

Session 2: Microprocessor Testing and Modeling

Session 3: Memory Test

Session 4: Design and Testability

Session 7: Test Equipment and Methods

Session 8: CODEC Testing

Session 9: Design for Testability/Self Test II

Session 10: Board Testing

Session 11: Precision Measurement, Calibration and Testing

Session 12: Test Economics

Session 13: Test System Architecture

Session 14: System Testing in the Field

Session 15: Functional Testing

Session 16: Software

Session 17: System Testing in Manufacturing

Session 18: Testing Valuation and Fault Coverage

Copyright © Mon Nov 2 20:54:05 2009 by Michael Ley (ley@uni-trier.de)