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ISQED 2006: San Jose, California, USA

7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA. IEEE Computer Society 2006, ISBN 0-7695-2523-7 CiteSeerX Google scholar pubzone.org BibTeX bibliographical record in XML

Introduction

ISQED Tutorials

ISQED Panel Discussion

ISQED Plenary Session

Session 1A: Variation Aware Timing

Session 1B: High-Level Design Verification

Session 1C: Physical Planning

ISQED Luncheon Speech

Session 2A: Robust Device and Circuit Design

Session 2B: Power, Noise and Timing Issues in DSM Designs

Session 2C: Memory Analysis

Session 2D: Posters

Session 3A: Interconnect Analysis and Optimization

Session 3B: Digital Test and Diagnosis Techniques

Session 3C: Back of Line DFM

ISQED Panel Discussion 2

ISQED Plenary Session 2

Session 4A: Analog Test and Self-Checking Design

Session 4B: Power Aware Designs and Memory Management

Session 4C: Technologies for Robust Design

Session 5A: IC-Package Design Challenges

Session 5B: IP, Interoperability: Design Optimization

Session 5C: DSM Interconnect Challenges

Session 6A: Leakage Analysis and Optimization

Session 6B: System Level Designs and Reliability Models

Session 6C: Modeling for DFM

Copyright © Mon Nov 2 20:53:40 2009 by Michael Ley (ley@uni-trier.de)