ICCAD 2008:
San Jose,
California,
USA
Sani R. Nassif, Jaijeet S. Roychowdhury (Eds.):
2008 International Conference on Computer-Aided Design (ICCAD'08), November 10-13, 2008, San Jose, CA, USA.
IEEE 2008, ISBN 978-1-4244-2820-5
Keynotes
Tutorials
- Subhasish Mitra, Ravishankar K. Iyer, Kishor S. Trivedi, James W. Tschanz:
Reliable system design: models, metrics and design techniques.
3
- Joel Phillips, Kurt Keutzer, Michael Wrinn:
Architecting parallel programs.
4
- Chao Wang, Malay K. Ganai, Shuvendu K. Lahiri, Daniel Kroening:
Embedded software verification: challenges and solutions.
5
- David Z. Pan, Stephen Renwick, Vivek Singh, Judy Huckabay:
Nanolithography and CAD challenges for 32nm/22nm and beyond.
6
Designer's panel
Panel
Floorplanning
Logic and high-level synthesis
Test power and temperature control
- Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara:
Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification.
52-58
- David R. Bild, Sanchit Misra, Thidapat Chantem, Prabhat Kumar, Robert P. Dick, Xiaobo Sharon Hu, Li Shang, Alok N. Choudhary:
Temperature-aware test scheduling for multiprocessor systems-on-chip.
59-66
- Jia Li, Xiao Liu, Yubin Zhang, Yu Hu, Xiaowei Li, Qiang Xu:
On capture power-aware test data compression for scan-based testing.
67-72
Simulation and optimization of analog systems
Physical synthesis and optimization
Decision procedures in verification
Power estimation and optimization
Recent progress in SSTA
- Khaled R. Heloue, Sari Onaissi, Farid N. Najm:
Efficient block-based parameterized timing analysis covering all potentially critical paths.
173-180
- Lin Xie, Azadeh Davoodi, Jun Zhang, Tai-Hsuan Wu:
Adjustment-based modeling for statistical static timing analysis with high dimension of variability.
181-184
- Farinaz Koushanfar, Petros Boufounos, Davood Shamsi:
Post-silicon timing characterization by compressed sensing.
185-189
- Amith Singhee, Sonia Singhal, Rob A. Rutenbar:
Practical, fast Monte Carlo statistical static timing analysis: why and how.
190-195
- Javid Jaffari, Mohab Anis:
On efficient Monte Carlo-based statistical static timing analysis of digital circuits.
196-203
Placement
- Tao Luo, David A. Papa, Zhuo Li, Chin-Ngai Sze, Charles J. Alpert, David Z. Pan:
Pyramids: an efficient computational geometry-based approach for timing-driven placement.
204-211
- Kalliopi Tsota, Cheng-Kok Koh, Venkataramanan Balakrishnan:
Guiding global placement with wire density.
212-217
- Hsin-Chen Chen, Yi-Lin Chuang, Yao-Wen Chang, Yung-Chung Chang:
Constraint graph-based macro placement for modern mixed-size circuit designs.
218-223
Sequential synthesis
System-level thermal and power management
Modeling and simulation of process variability
Placement and beyond
Circuit and system optimization and modeling
Global routing
System-level simulation
Analog and memory design enablers
- Wei Dong, Peng Li, Garng M. Huang:
SRAM dynamic stability: theory, variability and analysis.
378-385
- Jaeha Kim, Brian S. Leibowitz, Metha Jeeradit:
Impulse sensitivity function analysis of periodic circuits.
386-391
- Trent McConaghy, Pieter Palmers, Georges G. E. Gielen, Michiel Steyaert:
Automated extraction of expert knowledge in analog topology selection and sizing.
392-395
- Peng Gao, Trent McConaghy, Georges G. E. Gielen:
Importance sampled circuit learning ensembles for robust analog IC design.
396-399
Embedded tutorial:
Graphene electronics:
design and CAD challenges and opportunities
Physical design for performance improvement & noise immunity
Novel design methodologies for system architecture
- Timothy Kam, Michael Kishinevsky, Jordi Cortadella, Marc Galceran Oms:
Correct-by-construction microarchitectural pipelining.
434-441
- Dmitry Bufistov, Jorge Júlvez, Jordi Cortadella:
Performance optimization of elastic systems using buffer resizing and buffer insertion.
442-448
- Gennette Gill, Vishal Gupta, Montek Singh:
Performance estimation and slack matching for pipelined asynchronous architectures with choice.
449-456
- Myong Hyon Cho, Chih-Chi Cheng, Michel A. Kinsy, G. Edward Suh, Srinivas Devadas:
Diastolic arrays: throughput-driven reconfigurable computing.
457-464
DFM methods for advanced lithography
- Andrew B. Kahng, Chul-Hong Park, Xu Xu, Hailong Yao:
Layout decomposition for double patterning lithography.
465-472
- Shayak Banerjee, Praveen Elakkumanan, Lars Liebmann, Michael Orshansky:
Electrically driven optical proximity correction based on linear programming.
473-479
- Jinyu Zhang, Wei Xiong, Yan Wang, Zhiping Yu, Min-Chun Tsai:
A highly efficient optimization algorithm for pixel manipulation in inverse lithography technique.
480-487
- Jae-Seok Yang, David Z. Pan:
Overlay aware interconnect and timing variation modeling for double patterning technology.
488-493
- Alexey Lvov, Ulrich Finkler:
Exact basic geometric operations on arbitrary angle polygons using only fixed size integer coordinates.
494-498
Advances in routing
System-level optimization issues in highly parallel architectures
Advances in embedded systems
- B. V. N. Silpa, Anjul Patney, Tushar Krishna, Preeti Ranjan Panda, G. S. Visweswaran:
Texture filter memory: a power-efficient and scalable texture memory architecture for mobile graphics processors.
559-564
- Taylan Yemliha, Shekhar Srikantaiah, Mahmut T. Kandemir, Ozcan Ozturk:
SPM management using Markov chain based data access prediction.
565-569
- Love Singhal, Elaheh Bozorgzadeh:
Process variation aware system-level task allocation using stochastic ordering of delay distributions.
570-574
- Sanjit A. Seshia, Alexander Rakhlin:
Game-theoretic timing analysis.
575-582
- Taylan Yemliha, Shekhar Srikantaiah, Mahmut T. Kandemir, Mustafa Karaköy, Mary Jane Irwin:
Integrated code and data placement in two-dimensional mesh based chip multiprocessors.
583-588
Alternative circuit fabrics
Thermal analysis and optimization
Path delay anomaly identification for quality and security
Techniques for next generation interconnect modeling
Security issues in ICs
Modeling approaches for reliability and stress analysis
Improving FPGA reliability
Advances in model order reduction
Design techniques for emerging technologies
Embedded tutorial:
Learning from silicon:
correlating measurements,
models and design
Exploiting logic constraints for noise analysis
Advances in oscillator macromodeling
Copyright © Mon Nov 2 20:41:32 2009
by Michael Ley (ley@uni-trier.de)