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6. Asian Test Symposium 1997: Akita, Japan

6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita, Japan. IEEE Computer Society 1997, ISBN 0-8186-8209-4 CiteSeerX Google scholar pubzone.org BibTeX bibliographical record in XML
@proceedings{DBLP:conf/ats/1997,
  title     = {6th Asian Test Symposium (ATS '97), 17-18 November 1997, Akita,
               Japan},
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {1997},
  isbn      = {0-8186-8209-4},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Keynote Address

Test Generation I

Design for Testability I

Test Generation II

Fault Tolerance

Case Studies for DFT Techniques in Japanese Industry

Test Technologies

Beam Testing of VLSI Circuits in Japan

Mixed-Signal Test

Novel Beam Testing Techniques in Japan

Decision Diagrams and Logic Optimization

FPGA Test

Software Test

Diagnosis

Design for Testability II

Delay Test

Built-in Self-Test I

Current Testing

Built-in Self-Test II

Copyright © Mon Nov 2 20:21:17 2009 by Michael Ley (ley@uni-trier.de)