Heinrich Theodor Vierhaus Vis

*	2009
47	EE	Tobias Koal, Daniel Scheit, Heinrich Theodor Vierhaus: A scheme of logic self repair including local interconnects. DDECS 2009: 8-11
	2008
46	EE	Heinrich Theodor Vierhaus, René Kothe: Embedded Diagnostic Logic Test Exploiting Regularity. DSD 2008: 873-879
45	EE	Silvio Misera, Heinrich Theodor Vierhaus, André Sieber: Simulated fault injections and their acceleration in SystemC. Microprocessors and Microsystems - Embedded Hardware Design 32(5-6): 270-278 (2008)
	2007
44		René Kothe, Heinrich Theodor Vierhaus: Flip-Flops and Scan-Path Elements for Nanoelectronics. DDECS 2007: 307-312
43	EE	Heinrich Theodor Vierhaus, Helmut Rossmann, Silvio Misera: Timing- / Power-Optimization for Digital Logic Based on Standard Cells. DSD 2007: 303-306
42	EE	Silvio Misera, Heinrich Theodor Vierhaus, André Sieber: Fault Injection Techniques and their Accelerated Simulation in SystemC. DSD 2007: 587-595
41	EE	R. Frost Brandenburg, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus: A Configurable Modular Test Processor and Scan Controller Architecture. IOLTS 2007: 277-284
	2006
40		Christian Galke, René Kothe, Heinrich Theodor Vierhaus: Logic Self Repair. ARCS Workshops 2006: 36-44
39	EE	Udo Krautz, Matthias Pflanz, Christian Jacobi, Hans-Werner Tast, Kai Weber, Heinrich Theodor Vierhaus: Evaluating coverage of error detection logic for soft errors using formal methods. DATE 2006: 176-181
38		René Kothe, Christian Galke, S. Schultke, H. Froeschke, S. Gaede, Heinrich Theodor Vierhaus: Hardware/Software Based Hierarchical Self Test for SoCs. DDECS 2006: 159-160
37		René Kothe, Heinrich Theodor Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube: Embedded Self Repair by Transistor and Gate Level Reconfiguration. DDECS 2006: 210-215
36	EE	Silvio Misera, Heinrich Theodor Vierhaus, Lars Breitenfeld, André Sieber: A Mixed Language Fault Simulation of VHDL and SystemC. DSD 2006: 275-279
35	EE	Christian Galke, U. Gätzschmann, Heinrich Theodor Vierhaus: Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes. DSD 2006: 433-438
34	EE	Christian Galke, René Kothe, S. Schultke, K. Winkler, J. Honko, Heinrich Theodor Vierhaus: Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. IOLTS 2006: 181-182
33	EE	S. Habermann, René Kothe, Heinrich Theodor Vierhaus: Built-in Self Repair by Reconfiguration of FPGAs. IOLTS 2006: 187-188
	2005
32		Heinrich Theodor Vierhaus, Helmut Rossmann: Power-/Timing - Optimierung für Zellen-basierte Digitalschaltungen in Submikron-Technologien. GI Jahrestagung (1) 2005: 339-343
31	EE	René Kothe, Christian Galke, Heinrich Theodor Vierhaus: A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features. IOLTS 2005: 241-246
30	EE	Marcin Gomulkiewicz, Miroslaw Kutylowski, Heinrich Theodor Vierhaus, Pawel Wlaz: Synchronization Fault Cryptanalysis for Breaking A5/1. WEA 2005: 415-427
	2004
29	EE	Claudia Kretzschmar, Christian Galke, Heinrich Theodor Vierhaus: A Hierarchical Self Test Scheme for SoCs. IOLTS 2004: 37-44
28	EE	Silvio Misera, Heinrich Theodor Vierhaus: FIT - A Parallel Hierarchical Fault Simulation Environment. PARELEC 2004: 289-294
	2003
27	EE	Matthias Pflanz, Heinrich Theodor Vierhaus: Control Signal Protection For High Performance Processors. IOLTS 2003: 173-
26	EE	Christian Galke, Marcus Grabow, Heinrich Theodor Vierhaus: Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip. IOLTS 2003: 183-
25	EE	Matthias Pflanz, K. Walther, Christian Galke, Heinrich Theodor Vierhaus: On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check. J. Electronic Testing 19(5): 501-510 (2003)
	2002
24	EE	Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus: A Test Processor Concept for Systems-on-a-Chip. ICCD 2002: 210-
23	EE	Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus: On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures. IOLTW 2002: 178
22	EE	Matthias Pflanz, K. Walther, Christian Galke, Heinrich Theodor Vierhaus: On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check. IOLTW 2002: 69-73
	2001
21	EE	C. Rousselle, Matthias Pflanz, A. Behling, T. Mohaupt, Heinrich Theodor Vierhaus: A register-transfer-level fault simulator for permanent and transient faults in embedded processors. DATE 2001: 811
20	EE	Matthias Pflanz, K. Walther, Heinrich Theodor Vierhaus: On-line Error Detection Techniques for Dependable Embedded Processors with High Complexity. IOLTW 2001: 51-53
19	EE	Matthias Pflanz, Heinrich Theodor Vierhaus: Online Check and Recovery Techniques for Dependable Embedded Processors. IEEE Micro 21(5): 24-40 (2001)
	1999
18		Matthias Pflanz, Heinrich Theodor Vierhaus, F. Pompsch: An efficient on-line-test and back-up scheme for embedded processors. ITC 1999: 964-972
17	EE	Fulvio Corno, Uwe Gläser, Paolo Prinetto, Matteo Sonza Reorda, Heinrich Theodor Vierhaus, Massimo Violante: SymFony: a hybrid topological-symbolic ATPG exploiting RT-level information. IEEE Trans. on CAD of Integrated Circuits and Systems 18(2): 191-202 (1999)
	1997
16	EE	H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation. Great Lakes Symposium on VLSI 1997: 112-117
15		H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: A Parallel Approach Solving the Test Generation Problem for Synchronous Sequential Circuits. PARCO 1997: 549-556
14	EE	Uwe Hübner, Heinrich Theodor Vierhaus, Raul Camposano: Partitioning and analysis of static digital CMOS circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 16(11): 1292-1310 (1997)
	1996
13	EE	Jörg Wilberg, A. Kuth, Raul Camposano, Wolfgang Rosenstiel, Heinrich Theodor Vierhaus: A Design Exploration Environment. Great Lakes Symposium on VLSI 1996: 77-80
12		H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: Automatic Test Pattern Generation with Optimal Load Balancing. PVM 1996: 205-212
11	EE	Uwe Gläser, Heinrich Theodor Vierhaus: Mixed level test generation for synchronous sequential circuits using the FOGBUSTER algorithm. IEEE Trans. on CAD of Integrated Circuits and Systems 15(4): 410-423 (1996)
	1995
10	EE	Uwe Gläser, Heinrich Theodor Vierhaus: FOGBUSTER: an efficient algorithm for sequential test generation. EURO-DAC 1995: 230-235
9	EE	Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda, Uwe Gläser, Heinrich Theodor Vierhaus: Improving topological ATPG with symbolic techniques. VTS 1995: 338-343
	1994
8		Michel Langevin, Eduard Cerny, Jörg Wilberg, Heinrich Theodor Vierhaus: Local microcode generation in system design. Code Generation for Embedded Processors 1994: 171-187
7	EE	Uwe Gläser, Heinrich Theodor Vierhaus, M. Kley, A. Wiederhold: Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation. ICCAD 1994: 36-39
6		R. Wolber, Uwe Gläser, Heinrich Theodor Vierhaus: Testability Analysis for Test Generation in Synchronous Sequential Circuits. ICCD 1994: 350-353
	1993
5		Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser: CMOS Bridges and Resistive Transistor Faults: IDDQ versus Delay Effects. ITC 1993: 83-91
4	EE	Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser, Raul Camposano: Fault behavior and testability of asynchronous CMOS circuits. Microprocessing and Microprogramming 38(1-5): 223-228 (1993)
	1992
3	EE	Uwe Hübner, Heinrich Theodor Vierhaus: Efficient partitioning and analysis of digital CMOS-circuits. ICCAD 1992: 280-283
2		Ursula Westerholz, Heinrich Theodor Vierhaus: Library Mapping of CMOS-Switch-Level-Circuits by Extraction of Isomorphic Subgraphs. ICCD 1992: 472-475
1		Uwe Gläser, Uwe Hübner, Heinrich Theodor Vierhaus: Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects. ITC 1992: 21-29

Coauthor Index

1	A. Behling	[21]
2	R. Frost Brandenburg	[41]
3	Lars Breitenfeld	[36]
4	Raul Camposano	[4] [13] [14]
5	Eduard Cerny	[8]
6	Fulvio Corno	[9] [17]
7	Torsten Coym	[37]
8	H.-Ch. Dahmen	[12] [15] [16]
9	H. Froeschke	[38]
10	S. Gaede	[38]
11	Christian Galke	[22] [23] [24] [25] [26] [29] [31] [34] [35] [38] [40] [41]
12	U. Gätzschmann	[35]
13	Uwe Gläser	[1] [4] [5] [6] [7] [9] [10] [11] [12] [15] [16] [17]
14	Marcin Gomulkiewicz	[30]
15	Marcus Grabow	[26]
16	S. Habermann	[33]
17	J. Honko	[34]
18	Uwe Hübner	[1] [3] [14]
19	Christian Jacobi	[39]
20	M. Kley	[7]
21	Tobias Koal	[47]
22	René Kothe	[31] [33] [34] [37] [38] [40] [41] [44] [46]
23	Udo Krautz	[39]
24	Claudia Kretzschmar	[29]
25	A. Kuth	[13]
26	Miroslaw Kutylowski	[30]
27	Michel Langevin	[8]
28	Wolfgang Meyer	[4] [5]
29	Silvio Misera	[28] [36] [42] [43] [45]
30	T. Mohaupt	[21]
31	Matthias Pflanz	[18] [19] [20] [21] [22] [23] [24] [25] [27] [39]
32	F. Pompsch	[18]
33	Paolo Prinetto	[9] [17]
34	Matteo Sonza Reorda	[9] [17]
35	Wolfgang Rosenstiel	[13]
36	Helmut Rossmann	[32] [43]
37	C. Rousselle	[21]
38	D. Rudolph	[41]
39	Daniel Scheit	[47]
40	S. Schultke	[34] [38]
41	André Sieber	[36] [42] [45]
42	Bernd Straube	[37]
43	Hans-Werner Tast	[39]
44	Wolfgang Vermeiren	[37]
45	Massimo Violante	[17]
46	K. Walther	[20] [22] [25]
47	Kai Weber	[39]
48	Ursula Westerholz	[2]
49	A. Wiederhold	[7]
50	Jörg Wilberg	[8] [13]
51	K. Winkler	[34]
52	Pawel Wlaz	[30]
53	R. Wolber	[6]

Colors in the list of coauthors